DEFECT CHARACTERIZATION BY ULTRASONIC SIGNAL PROCESS TECHNIQUES.

R. K. Elsley, Bernhard R. Tittmann, H. L. Nadler, L. A. Ahlberg

Research output: Contribution to conferencePaper

1 Citation (Scopus)

Abstract

Small defects in structural materials can be successfully characterized if ultrasonic waves scattered from them are captured and analyzed by simple signal processing algorithms. Angular and frequency dependence of the scattered signals give information about the size, shape, orientation and material content of the defects. Depending on how much is already known about a defect, a variety of algorithms can be used to estimate the unknown properties. In particular, a technique for measuring defect size independently of material content by the use of the frequency dependence of the phase spectrum is suggested. Applications of several such algorithms to commercial alloys are shown.

Original languageEnglish (US)
Pages48-52
Number of pages5
StatePublished - Jan 1 2017
EventUltrason Symp Proc - Phoenix, AZ, USA
Duration: Oct 26 1977Oct 28 1977

Other

OtherUltrason Symp Proc
CityPhoenix, AZ, USA
Period10/26/7710/28/77

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Ultrasonics
Defects
Ultrasonic waves
Signal processing

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Elsley, R. K., Tittmann, B. R., Nadler, H. L., & Ahlberg, L. A. (2017). DEFECT CHARACTERIZATION BY ULTRASONIC SIGNAL PROCESS TECHNIQUES.. 48-52. Paper presented at Ultrason Symp Proc, Phoenix, AZ, USA, .
Elsley, R. K. ; Tittmann, Bernhard R. ; Nadler, H. L. ; Ahlberg, L. A. / DEFECT CHARACTERIZATION BY ULTRASONIC SIGNAL PROCESS TECHNIQUES. Paper presented at Ultrason Symp Proc, Phoenix, AZ, USA, .5 p.
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Elsley, RK, Tittmann, BR, Nadler, HL & Ahlberg, LA 2017, 'DEFECT CHARACTERIZATION BY ULTRASONIC SIGNAL PROCESS TECHNIQUES.' Paper presented at Ultrason Symp Proc, Phoenix, AZ, USA, 10/26/77 - 10/28/77, pp. 48-52.

DEFECT CHARACTERIZATION BY ULTRASONIC SIGNAL PROCESS TECHNIQUES. / Elsley, R. K.; Tittmann, Bernhard R.; Nadler, H. L.; Ahlberg, L. A.

2017. 48-52 Paper presented at Ultrason Symp Proc, Phoenix, AZ, USA, .

Research output: Contribution to conferencePaper

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Elsley RK, Tittmann BR, Nadler HL, Ahlberg LA. DEFECT CHARACTERIZATION BY ULTRASONIC SIGNAL PROCESS TECHNIQUES.. 2017. Paper presented at Ultrason Symp Proc, Phoenix, AZ, USA, .