Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study

N. Alem, O. V. Yazyev, Q. M. Ramasse, C. R. Seabourne, C. K. Kisielowski, P. Hartel, B. Jiang, R. Erni, A. J. Scott, S. G. Louie, A. Zettl

Research output: Contribution to journalArticle

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Original languageEnglish (US)
Pages (from-to)1516-1517
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
Issue numberS2
DOIs
StatePublished - Jul 2012

All Science Journal Classification (ASJC) codes

  • Instrumentation

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    Alem, N., Yazyev, O. V., Ramasse, Q. M., Seabourne, C. R., Kisielowski, C. K., Hartel, P., Jiang, B., Erni, R., Scott, A. J., Louie, S. G., & Zettl, A. (2012). Defects in Two Dimensional Crystals: An Ultra-high Resolution Aberration-corrected Electron Microscopy Study. Microscopy and Microanalysis, 18(S2), 1516-1517. https://doi.org/10.1017/S1431927612009439