Defractalization of films adsorbed on fractal surfaces

E. Cheng, Milton W. Cole, Peter Pfeifer

Research output: Contribution to journalArticle

28 Citations (Scopus)

Abstract

We report a calculation of small-angle x-ray and neutron scattering from films adsorbed on fractal surfaces. The film is shown to defractalize the substrate surface in the sense that the film thickness d becomes the new lower limit of the length scale of fractality. Fractal behavior can be observed only in the range of the scattering wave vector q1d, while a smooth-surface result is expected in the limit qd1. A scaling formula for the scattered intensity I as a function of qd is derived. When applied to films in equilibrium with their vapor, it predicts the scattering curve as a function of pressure. The formula can also be applied to the scattering from "dry" samples (without films); the "thickness" d then provides a natural definition of the lower limit of the fractal regime.

Original languageEnglish (US)
Pages (from-to)12962-12965
Number of pages4
JournalPhysical Review B
Volume39
Issue number17
DOIs
StatePublished - Jan 1 1989

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fractals
wave scattering
x ray scattering
scattering
neutron scattering
film thickness
vapors
scaling
curves

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

Cite this

Cheng, E. ; Cole, Milton W. ; Pfeifer, Peter. / Defractalization of films adsorbed on fractal surfaces. In: Physical Review B. 1989 ; Vol. 39, No. 17. pp. 12962-12965.
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Cheng, E, Cole, MW & Pfeifer, P 1989, 'Defractalization of films adsorbed on fractal surfaces', Physical Review B, vol. 39, no. 17, pp. 12962-12965. https://doi.org/10.1103/PhysRevB.39.12962

Defractalization of films adsorbed on fractal surfaces. / Cheng, E.; Cole, Milton W.; Pfeifer, Peter.

In: Physical Review B, Vol. 39, No. 17, 01.01.1989, p. 12962-12965.

Research output: Contribution to journalArticle

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