Defractalization of films adsorbed on fractal surfaces

E. Cheng, Milton W. Cole, Peter Pfeifer

Research output: Contribution to journalArticle

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Abstract

We report a calculation of small-angle x-ray and neutron scattering from films adsorbed on fractal surfaces. The film is shown to defractalize the substrate surface in the sense that the film thickness d becomes the new lower limit of the length scale of fractality. Fractal behavior can be observed only in the range of the scattering wave vector q1d, while a smooth-surface result is expected in the limit qd1. A scaling formula for the scattered intensity I as a function of qd is derived. When applied to films in equilibrium with their vapor, it predicts the scattering curve as a function of pressure. The formula can also be applied to the scattering from "dry" samples (without films); the "thickness" d then provides a natural definition of the lower limit of the fractal regime.

Original languageEnglish (US)
Pages (from-to)12962-12965
Number of pages4
JournalPhysical Review B
Volume39
Issue number17
DOIs
StatePublished - Jan 1 1989

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All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics

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