Density profile of a hole at the fractional Hall edge

Sang Jeon Gun, Jainendra K. Jain

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The density profile of a hole excitation is investigated when it is located at the edge of the fractional quantum Hall state at filling factor 1/3. Of interest is the issue how the hole profile decays at long distances, both along the edge and into the bulk. We find that the hole is exponentially localized in both directions. Its localization length along the edge depends on the range of the interelectron interaction, increasing roughly by a factor of two in going from a short-range interaction to the long-range Coulomb interaction.

Original languageEnglish (US)
Article number045337
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume71
Issue number4
DOIs
StatePublished - Jan 1 2005

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Coulomb interactions
profiles
interactions
decay
excitation
Direction compound

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

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Density profile of a hole at the fractional Hall edge. / Gun, Sang Jeon; Jain, Jainendra K.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 71, No. 4, 045337, 01.01.2005.

Research output: Contribution to journalArticle

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