Data from field operations of a system is often used to estimate the reliability of components. Under ideal circumstances, this system field data contains the time to failure along with information on the exact component responsible for the system failure. However, in many cases, the exact component causing the failure of the system cannot be identified, and is considered to be masked. Previously developed models for estimation of component reliability from masked system life data have been based upon the assumption that masking occurs independently of the true cause of system failure. In this paper we develop a Bayesian methodology for estimating component reliabilities from masked system life data when the probability of masking is dependent upon the true cause of system failure. The Bayesian approach is illustrated for the case of a two-component system of exponentially distributed components.
All Science Journal Classification (ASJC) codes
- Applied Mathematics