DEPTH PROFILES OF SODIUM AND CALCIUM IN GLASSES: A COMPARISON OF SECONDARY ION MASS ANALYSIS AND AUGER SPECTROMETRY.

D. L. Malm, M. J. Vasile, F. J. Padden, D. B. Dove, C. G. Pantano

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

Depth profiles of sodium and calcium in soda-lime glasses have been measured by both Auger electron spectrometry and secondary ion mass spectrometry. Profiles by the two techniques agree closely and can be influenced by experimental conditions. In particular, radiation heating from a charge neutralization filament in the SIMS system is shown to alter the sodium depth profile in specimens which have a surface depletion of sodium.

Original languageEnglish (US)
Pages (from-to)35-38
Number of pages4
JournalJ VAC SCI TECHNOL
Volume15
Issue number1
DOIs
StatePublished - Jan 1 1978

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Spectrometry
Calcium
Sodium
Secondary ion mass spectrometry
Glass
Ions
Lime
Radiation
Heating
Electrons

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Malm, D. L. ; Vasile, M. J. ; Padden, F. J. ; Dove, D. B. ; Pantano, C. G. / DEPTH PROFILES OF SODIUM AND CALCIUM IN GLASSES : A COMPARISON OF SECONDARY ION MASS ANALYSIS AND AUGER SPECTROMETRY. In: J VAC SCI TECHNOL. 1978 ; Vol. 15, No. 1. pp. 35-38.
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DEPTH PROFILES OF SODIUM AND CALCIUM IN GLASSES : A COMPARISON OF SECONDARY ION MASS ANALYSIS AND AUGER SPECTROMETRY. / Malm, D. L.; Vasile, M. J.; Padden, F. J.; Dove, D. B.; Pantano, C. G.

In: J VAC SCI TECHNOL, Vol. 15, No. 1, 01.01.1978, p. 35-38.

Research output: Contribution to journalArticle

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