DEPTH PROFILES OF SODIUM AND CALCIUM IN GLASSES: A COMPARISON OF SECONDARY ION MASS ANALYSIS AND AUGER SPECTROMETRY.

D. L. Malm, M. J. Vasile, F. J. Padden, D. B. Dove, C. G. Pantano

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Abstract

Depth profiles of sodium and calcium in soda-lime glasses have been measured by both Auger electron spectrometry and secondary ion mass spectrometry. Profiles by the two techniques agree closely and can be influenced by experimental conditions. In particular, radiation heating from a charge neutralization filament in the SIMS system is shown to alter the sodium depth profile in specimens which have a surface depletion of sodium.

Original languageEnglish (US)
Pages (from-to)35-38
Number of pages4
JournalJ VAC SCI TECHNOL
Volume15
Issue number1
DOIs
StatePublished - Jan 1 1978

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All Science Journal Classification (ASJC) codes

  • Engineering(all)

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