Design and analysis of novel SRAM PUFs with embedded latch for robustness

Jae Won Jang, Swaroop Ghosh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

20 Scopus citations

Abstract

Physical Unclonable Function (PUF) is a cost-effective security primitive to address hardware attacks such as cloning, impersonation and Intellectual Property (IP) violation. Static Random-Access Memory (SRAM) PUF has been proposed; however, it suffers from challenges, some of which are environmental fluctuations such as voltage, temperature, and noise. Ensuring the robustness of SRAM PUF under such conditions is challenging. In this paper, we propose 8T SRAM PUF with a back-to-back PMOS latch to improve robustness by 4X. We also propose a low-power 7T SRAM with embedded Magnetic Tunnel Junction (MTJ) devices to enhance the robustness (2.3X to 20X) while lowering the leakage power and area overhead.

Original languageEnglish (US)
Title of host publicationProceedings of the 16th International Symposium on Quality Electronic Design, ISQED 2015
PublisherIEEE Computer Society
Pages298-302
Number of pages5
ISBN (Electronic)9781479975815
DOIs
StatePublished - Apr 13 2015
Event16th International Symposium on Quality Electronic Design, ISQED 2015 - Santa Clara, United States
Duration: Mar 2 2015Mar 4 2015

Publication series

NameProceedings - International Symposium on Quality Electronic Design, ISQED
Volume2015-April
ISSN (Print)1948-3287
ISSN (Electronic)1948-3295

Other

Other16th International Symposium on Quality Electronic Design, ISQED 2015
CountryUnited States
CitySanta Clara
Period3/2/153/4/15

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Jang, J. W., & Ghosh, S. (2015). Design and analysis of novel SRAM PUFs with embedded latch for robustness. In Proceedings of the 16th International Symposium on Quality Electronic Design, ISQED 2015 (pp. 298-302). [7085443] (Proceedings - International Symposium on Quality Electronic Design, ISQED; Vol. 2015-April). IEEE Computer Society. https://doi.org/10.1109/ISQED.2015.7085443