Design and development of a phase sensitive V(z) response measurement system in the 20-150 MHz frequency range

S. Parthasarathi, Bernhard R. Tittmann

Research output: Contribution to journalArticle

Abstract

Quantitative acoustic microscopy involves the measurement of the Voltage-Defocus response or the V(z) response followed by subsequent analysis to extract material characteristics such as surface wave velocity and attenuation. An amplitude and phase measuring acoustic microscopy system has been developed with commercially available tone-burst equipment for accurate mono-frequency measurements in the 20-150 MHz regime. The Rayleigh wave velocities of various materials were extracted using the new system and these were in good agreement with the published values.

Original languageEnglish (US)
Pages (from-to)127-138
Number of pages12
JournalNondestructive Testing and Evaluation
Volume13
Issue number3
DOIs
StatePublished - Jan 1 1997

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frequency ranges
microscopy
Rayleigh waves
acoustics
frequency measurement
Surface waves
surface waves
bursts
attenuation
Electric potential
electric potential
Acoustic Microscopy

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering
  • Physics and Astronomy(all)

Cite this

@article{3ef406feb8ae42069aa3caa282ec6998,
title = "Design and development of a phase sensitive V(z) response measurement system in the 20-150 MHz frequency range",
abstract = "Quantitative acoustic microscopy involves the measurement of the Voltage-Defocus response or the V(z) response followed by subsequent analysis to extract material characteristics such as surface wave velocity and attenuation. An amplitude and phase measuring acoustic microscopy system has been developed with commercially available tone-burst equipment for accurate mono-frequency measurements in the 20-150 MHz regime. The Rayleigh wave velocities of various materials were extracted using the new system and these were in good agreement with the published values.",
author = "S. Parthasarathi and Tittmann, {Bernhard R.}",
year = "1997",
month = "1",
day = "1",
doi = "10.1080/10589759708953024",
language = "English (US)",
volume = "13",
pages = "127--138",
journal = "Nondestructive Testing and Evaluation",
issn = "1058-9759",
publisher = "Taylor and Francis Ltd.",
number = "3",

}

Design and development of a phase sensitive V(z) response measurement system in the 20-150 MHz frequency range. / Parthasarathi, S.; Tittmann, Bernhard R.

In: Nondestructive Testing and Evaluation, Vol. 13, No. 3, 01.01.1997, p. 127-138.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Design and development of a phase sensitive V(z) response measurement system in the 20-150 MHz frequency range

AU - Parthasarathi, S.

AU - Tittmann, Bernhard R.

PY - 1997/1/1

Y1 - 1997/1/1

N2 - Quantitative acoustic microscopy involves the measurement of the Voltage-Defocus response or the V(z) response followed by subsequent analysis to extract material characteristics such as surface wave velocity and attenuation. An amplitude and phase measuring acoustic microscopy system has been developed with commercially available tone-burst equipment for accurate mono-frequency measurements in the 20-150 MHz regime. The Rayleigh wave velocities of various materials were extracted using the new system and these were in good agreement with the published values.

AB - Quantitative acoustic microscopy involves the measurement of the Voltage-Defocus response or the V(z) response followed by subsequent analysis to extract material characteristics such as surface wave velocity and attenuation. An amplitude and phase measuring acoustic microscopy system has been developed with commercially available tone-burst equipment for accurate mono-frequency measurements in the 20-150 MHz regime. The Rayleigh wave velocities of various materials were extracted using the new system and these were in good agreement with the published values.

UR - http://www.scopus.com/inward/record.url?scp=0030721375&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0030721375&partnerID=8YFLogxK

U2 - 10.1080/10589759708953024

DO - 10.1080/10589759708953024

M3 - Article

AN - SCOPUS:0030721375

VL - 13

SP - 127

EP - 138

JO - Nondestructive Testing and Evaluation

JF - Nondestructive Testing and Evaluation

SN - 1058-9759

IS - 3

ER -