Design and fabrication of digital dual-frequency patterns for projected fringe profilometry

Wei Hung Su, Yi Ling Hsu, Cho Yo Kuo, Hong Ming Chen, Wei Chen Su, Shizhuo Yin

    Research output: Contribution to journalConference article

    Abstract

    One key problem of fringe projection techniques for 3D shape measurements is the limited phase unambiguity range when only one grating period is used. Dual-frequency patterns in which involves two grating periods can easily extend the unambiguity range. A method to fabricate accurate dual-frequency patterns is presented. The advantage of using digital dual-frequency patterns for projected fringe profilometry are (1) high geometrical accuracy (< 0.5μm); (2) high contrast ratio; (3) very low high order harmonic distortions; and (4) extended unambiguity range.

    Original languageEnglish (US)
    Article number20
    Pages (from-to)132-141
    Number of pages10
    JournalProceedings of SPIE - The International Society for Optical Engineering
    Volume5606
    DOIs
    StatePublished - Dec 1 2004
    EventTwo- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II - Philadelphia, PA, United States
    Duration: Oct 26 2004Oct 27 2004

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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