Detection of high mass cluster ions sputtered from Bi surfaces

A. Shepard, R. W. Hewitt, G. J. Slusser, W. E. Baitinger, R. G. Cooks, N. Winograd, W. N. Delgass, A. Varon, G. Devant

Research output: Contribution to journalArticle

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Abstract

The technique of secondary ion mass spectrometry (SIMS) has been employed to detect Bi+3 ions and associated oxides Bi3O+x (x ≈ 1 to 4) from a Bi foil. Using a 3 keV Ar+ ion primary beam of 5 × 10-7 A/cm2, mass resolution to nearly 700 with the requisite sensitivity has been achieved. The Bi surface was also monitored by X-ray photoelectron spectroscopy (XPS or ESCA). The presence of a weak O 1s peak at 532.7 eV and a strong SIMS Bi+3 peak is interpreted to mean that the oxygen is weakly incorporated into the Bi lattice without disrupting metalmetal bonds.

Original languageEnglish (US)
Pages (from-to)371-373
Number of pages3
JournalChemical Physics Letters
Volume44
Issue number2
DOIs
StatePublished - Dec 1 1976

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Secondary ion mass spectrometry
secondary ion mass spectrometry
X ray photoelectron spectroscopy
Ions
disrupting
Oxides
Metal foil
foils
ions
photoelectron spectroscopy
Oxygen
oxides
sensitivity
oxygen
x rays

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

Cite this

Shepard, A., Hewitt, R. W., Slusser, G. J., Baitinger, W. E., Cooks, R. G., Winograd, N., ... Devant, G. (1976). Detection of high mass cluster ions sputtered from Bi surfaces. Chemical Physics Letters, 44(2), 371-373. https://doi.org/10.1016/0009-2614(76)80533-7
Shepard, A. ; Hewitt, R. W. ; Slusser, G. J. ; Baitinger, W. E. ; Cooks, R. G. ; Winograd, N. ; Delgass, W. N. ; Varon, A. ; Devant, G. / Detection of high mass cluster ions sputtered from Bi surfaces. In: Chemical Physics Letters. 1976 ; Vol. 44, No. 2. pp. 371-373.
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Shepard, A, Hewitt, RW, Slusser, GJ, Baitinger, WE, Cooks, RG, Winograd, N, Delgass, WN, Varon, A & Devant, G 1976, 'Detection of high mass cluster ions sputtered from Bi surfaces', Chemical Physics Letters, vol. 44, no. 2, pp. 371-373. https://doi.org/10.1016/0009-2614(76)80533-7

Detection of high mass cluster ions sputtered from Bi surfaces. / Shepard, A.; Hewitt, R. W.; Slusser, G. J.; Baitinger, W. E.; Cooks, R. G.; Winograd, N.; Delgass, W. N.; Varon, A.; Devant, G.

In: Chemical Physics Letters, Vol. 44, No. 2, 01.12.1976, p. 371-373.

Research output: Contribution to journalArticle

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T1 - Detection of high mass cluster ions sputtered from Bi surfaces

AU - Shepard, A.

AU - Hewitt, R. W.

AU - Slusser, G. J.

AU - Baitinger, W. E.

AU - Cooks, R. G.

AU - Winograd, N.

AU - Delgass, W. N.

AU - Varon, A.

AU - Devant, G.

PY - 1976/12/1

Y1 - 1976/12/1

N2 - The technique of secondary ion mass spectrometry (SIMS) has been employed to detect Bi+3 ions and associated oxides Bi3O+x (x ≈ 1 to 4) from a Bi foil. Using a 3 keV Ar+ ion primary beam of 5 × 10-7 A/cm2, mass resolution to nearly 700 with the requisite sensitivity has been achieved. The Bi surface was also monitored by X-ray photoelectron spectroscopy (XPS or ESCA). The presence of a weak O 1s peak at 532.7 eV and a strong SIMS Bi+3 peak is interpreted to mean that the oxygen is weakly incorporated into the Bi lattice without disrupting metalmetal bonds.

AB - The technique of secondary ion mass spectrometry (SIMS) has been employed to detect Bi+3 ions and associated oxides Bi3O+x (x ≈ 1 to 4) from a Bi foil. Using a 3 keV Ar+ ion primary beam of 5 × 10-7 A/cm2, mass resolution to nearly 700 with the requisite sensitivity has been achieved. The Bi surface was also monitored by X-ray photoelectron spectroscopy (XPS or ESCA). The presence of a weak O 1s peak at 532.7 eV and a strong SIMS Bi+3 peak is interpreted to mean that the oxygen is weakly incorporated into the Bi lattice without disrupting metalmetal bonds.

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