Determination of subsurface damage in single crystalline optical materials

Joseph A. Randi, III, J. C. Lambropoulos, S. D. Jacobs, Shai N. Shafrir

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Peak-to-valley surface microroughness measurement data acquired from a white light interferometer are compared with data from the actual depth of subsurface damage (SSD) acquired destructively, in single crystalline optical materials (Si, CaF, MgF2, LiNbO3, Al2O3) after deterministic microgrinding (DMG). The results demonstrate that SSD is always less than 1.4 times the peak-to-valley surface microroughness for these crystals regardless of crystallographic orientation. These results enable a maximum depth of SSD to be predicted non-invasively for these single crystal materials. The Center for Optics Manufacturing also has an extensive database comparing surface microroughness to SSD in optical glasses. This data will be presented, demonstrating the upper bound for SSD depth in optical glasses based on the surface microroughness. Interferometer settings and destructive techniques for physically determining SSD will be presented.

Original languageEnglish (US)
Title of host publicationOptifab 2003
Subtitle of host publicationTechnical Digest
EditorsHarvey M. Pollicove, Walter C. Czajkowski, Toshihide Dohi, Hans Lauth
PublisherSPIE
Pages84-86
Number of pages3
Volume10314
ISBN (Electronic)9780819451040
DOIs
StatePublished - May 19 2003
EventOptifab 2003: Technical Digest - Rochester, United States
Duration: May 19 2003May 22 2003

Other

OtherOptifab 2003: Technical Digest
CountryUnited States
CityRochester
Period5/19/035/22/03

Fingerprint

Subsurface Damage
Optical Materials
Optical materials
optical materials
Optical glass
Crystalline materials
damage
Interferometers
Surface measurement
Interferometer
Crystal orientation
valleys
Optics
interferometers
Single crystals
Crystals
glass
Single Crystal
Crystal
manufacturing

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Randi, III, J. A., Lambropoulos, J. C., Jacobs, S. D., & Shafrir, S. N. (2003). Determination of subsurface damage in single crystalline optical materials. In H. M. Pollicove, W. C. Czajkowski, T. Dohi, & H. Lauth (Eds.), Optifab 2003: Technical Digest (Vol. 10314, pp. 84-86). [103140T] SPIE. https://doi.org/10.1117/12.2284018
Randi, III, Joseph A. ; Lambropoulos, J. C. ; Jacobs, S. D. ; Shafrir, Shai N. / Determination of subsurface damage in single crystalline optical materials. Optifab 2003: Technical Digest. editor / Harvey M. Pollicove ; Walter C. Czajkowski ; Toshihide Dohi ; Hans Lauth. Vol. 10314 SPIE, 2003. pp. 84-86
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Randi, III, JA, Lambropoulos, JC, Jacobs, SD & Shafrir, SN 2003, Determination of subsurface damage in single crystalline optical materials. in HM Pollicove, WC Czajkowski, T Dohi & H Lauth (eds), Optifab 2003: Technical Digest. vol. 10314, 103140T, SPIE, pp. 84-86, Optifab 2003: Technical Digest, Rochester, United States, 5/19/03. https://doi.org/10.1117/12.2284018

Determination of subsurface damage in single crystalline optical materials. / Randi, III, Joseph A.; Lambropoulos, J. C.; Jacobs, S. D.; Shafrir, Shai N.

Optifab 2003: Technical Digest. ed. / Harvey M. Pollicove; Walter C. Czajkowski; Toshihide Dohi; Hans Lauth. Vol. 10314 SPIE, 2003. p. 84-86 103140T.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Randi, III JA, Lambropoulos JC, Jacobs SD, Shafrir SN. Determination of subsurface damage in single crystalline optical materials. In Pollicove HM, Czajkowski WC, Dohi T, Lauth H, editors, Optifab 2003: Technical Digest. Vol. 10314. SPIE. 2003. p. 84-86. 103140T https://doi.org/10.1117/12.2284018