Determination of the stacking order of curved few-layered graphene systems

Takuya Hayashi, Hiroyuki Muramatsu, Daisuke Shimamoto, Kazunori Fujisawa, Tomohiro Tojo, Yoshitaka Muramoto, Takuya Yokomae, Toru Asaoka, Yoong Ahm Kim, Mauricio Terrones, Morinobu Endo

Research output: Contribution to journalArticle

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Abstract

We report a facile method to efficiently visualize the atomic carbon network of curved few-layered graphitic systems including folded bi-layer graphene, nanoribbon edges and multi-walled carbon nanotubes (straight and bent), via the processing of aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM) images. This technique is also able to atomically resolve the structure of overlapping graphene layers with different orientations, thus enabling us to determine the stacking order of multiple graphene layers. To the best of our knowledge, we are the first to identify the stacking order of a misoriented 4-layer closed-edge graphene and a metal-semiconductor double-walled carbon nanotube junction.

Original languageEnglish (US)
Pages (from-to)6419-6424
Number of pages6
JournalNanoscale
Volume4
Issue number20
DOIs
StatePublished - Oct 21 2012

All Science Journal Classification (ASJC) codes

  • Materials Science(all)

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    Hayashi, T., Muramatsu, H., Shimamoto, D., Fujisawa, K., Tojo, T., Muramoto, Y., Yokomae, T., Asaoka, T., Kim, Y. A., Terrones, M., & Endo, M. (2012). Determination of the stacking order of curved few-layered graphene systems. Nanoscale, 4(20), 6419-6424. https://doi.org/10.1039/c2nr30883e