Development and applications of time-of-flight neutron depth profiling (TOF-NDP)

S. M. Çetiner, K. Ünlü, R. G. Downing

Research output: Contribution to journalArticle

9 Scopus citations

Abstract

Neutron depth profiling (NDP) is a surface analysis technique based on the irradiation of samples with thermal or sub-thermal neutrons, and subsequent release of charged particles. Emitted particles rapidly lose kinetic energy primarily through interactions with the electrons of the substrate material. The depth of the reaction site can be found by using stopping power correlations. In conventional NDP, particle residual energy is measured by using a silicon semiconductor detector. In time-of-flight NDP (TOF-NDP), the energy can be determined by particle flight time. Time measurement can be made more sensitively than the energy measurement. Silicon semiconductor detectors can be replaced by microchannel plates (MCP). In this study, TOF-NDP concept will be briefly explained; Penn State TOF-NDP facility will be introduced; preliminary measurements performed with an alpha-source will be presented.

Original languageEnglish (US)
Pages (from-to)623-630
Number of pages8
JournalJournal of Radioanalytical and Nuclear Chemistry
Volume276
Issue number3
DOIs
StatePublished - Jun 2008

All Science Journal Classification (ASJC) codes

  • Analytical Chemistry
  • Nuclear Energy and Engineering
  • Radiology Nuclear Medicine and imaging
  • Pollution
  • Spectroscopy
  • Public Health, Environmental and Occupational Health
  • Health, Toxicology and Mutagenesis

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