Development of EM-CCD-based X-ray detector for synchrotron applications

J. H. Tutt, D. J. Hall, M. R. Soman, A. D. Holland, A. Warren, T. Connolley, A. M. Evagora

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

A high speed, low noise camera system for crystallography and X-ray imaging applications is developed and successfully demonstrated. By coupling an electron-multiplying (EM)-CCD to a 3:1 fibre-optic taper and a CsI(Tl) scintillator, it was possible to detect hard X-rays. This novel approach to hard X-ray imaging takes advantage of subelectron equivalent readout noise performance at high pixel readout frequencies of EM-CCD detectors with the increase in the imaging area that is offered through the use of a fibre-optic taper. Compared with the industry state of the art, based on CCD camera systems, a high frame rate for a full-frame readout (50 ms) and a lower readout noise (<1 electron root mean square) across a range of X-ray energies (6-18 keV) were achieved.

Original languageEnglish (US)
Pages (from-to)1224-1226
Number of pages3
JournalElectronics Letters
Volume50
Issue number17
DOIs
StatePublished - Aug 14 2014

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Development of EM-CCD-based X-ray detector for synchrotron applications'. Together they form a unique fingerprint.

Cite this