Development of embedded-atom potentials and prediction of properties for binary Ti-V

Shun Li Shang, Yu Qin Liu, Ke Wu Bai, Jian Yun Shen, Xi Zhe Wang

Research output: Contribution to journalArticlepeer-review

Abstract

The embedded atom potentials for binary Ti-V were developed and used to predict the mechanical properties of binary Ti-V solid solutions with hcp and bcc structures including lattice parameters, elastic constants and fracture toughness for Mode- I fracture under plane strain. The calculation results show that with the increment of V-content, the lattice parameters and elastic constants decrease but the fracture toughness increases for hep solid solutions, the lattice parameters decrease but the elastic constants and fracture toughness increase for bcc solid solutions. The calculation results agree well with the available experiment values.

Original languageEnglish (US)
Pages (from-to)635-638
Number of pages4
JournalTransactions of Nonferrous Metals Society of China (English Edition)
Volume10
Issue number5
StatePublished - Dec 1 2000

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Geotechnical Engineering and Engineering Geology
  • Metals and Alloys
  • Materials Chemistry

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