Development of the materials analysis and particle probe for Proto-MPEX

C. J. Beers, C. Jaramillo, N. C. Reid, H. Schamis, J. P. Allain, J. B.O. Caughman, S. J. Meitner, J. Rapp, S. J. Zinkle

Research output: Contribution to journalArticlepeer-review

Abstract

The Prototype Material Plasma Exposure eXperiment (Proto-MPEX) is a linear plasma device being used in plasma source research and development (R&D) for the proposed MPEX. Once the R&D is completed, this device can also be used to perform plasma-material interaction studies. To perform these studies, a new materials analysis and particle probe (MAPP) has been constructed. The MAPP’s components are a sample holder and manipulator and a custom vacuum chamber with ports to facilitate surface chemistry diagnostics. The MAPP’s overall design enables rapid sample turnaround and in vacuo surface characterization. The surface analysis vacuum chamber has ports for x-ray photoelectron spectroscopy, thermal desorption spectroscopy, back-scatter ion scattering spectroscopy, forward-scatter ion scattering spectroscopy, and direct recoil spectroscopy. The sample manipulator and holder is a Lesker/UHV Multi-Centre Analytical Stage, which is used to place the samples in the exposure region of the Proto-MPEX or the analysis position in the MAPP vacuum chamber. The sample holder has a heating capability of up to 1200 °C for heated exposure and for desorption studies. In this work, we present the MAPP’s design and the first tungsten sample exposure with ex situ analysis that shows a surface deposition layer on the exposed target, highlighting the need for additional in situ measurements on the Proto-MPEX.

Original languageEnglish (US)
Article number045108
JournalReview of Scientific Instruments
Volume92
Issue number4
DOIs
StatePublished - Apr 1 2021

All Science Journal Classification (ASJC) codes

  • Instrumentation

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