Development status of adjustable grazing incidence optics for 0.5 arc second X-ray imaging

Paul B. Reid, Thomas L. Aldcroft, Vincenzo Cotroneo, William Davis, Reagan L. Johnson-Wilke, Stuart McMuldroch, Brian D. Ramsey, Daniel A. Schwartz, Susan Trolier-McKinstry, Alexey Vikhlinin, Rudeger H.T. Wilke

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Scopus citations

Abstract

We describe progress in the development of adjustable grazing incidence X-ray optics for 0.5 arcsec resolution cosmic X-ray imaging. To date, no optics technology is available to blend high resolution imaging like the Chandra X-ray Observatory, with square meter collecting area. Our approach to achieve these goals simultaneously is to directly deposit thin film piezoelectric actuators on the back surface of thin, lightweight Wolter-I or Wolter- Schwarschild mirror segments. The actuators are used to correct mirror figure errors due to fabrication, mounting and alignment, using calibration and a one-time figure adjustment on the ground. If necessary, it will also be possible to correct for residual gravity release and thermal effects on-orbit. In this paper we discuss our most recent results in operating multiple adjusters, and extending the process from flat test mirrors to cylindrical and conical test mirror segments. A comparison of modeled and measured influence functions is shown. We also present simulation results showing the process is consistent with the achievement of half arcsec imaging.

Original languageEnglish (US)
Title of host publicationOptics for EUV, X-Ray, and Gamma-Ray Astronomy VI
DOIs
StatePublished - 2013
EventOptics for EUV, X-Ray, and Gamma-Ray Astronomy VI - San Diego, CA, United States
Duration: Aug 26 2013Aug 29 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8861
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherOptics for EUV, X-Ray, and Gamma-Ray Astronomy VI
CountryUnited States
CitySan Diego, CA
Period8/26/138/29/13

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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