Dielectric and piezoelectric properties of lead-free (Bi,Na)TiO 3-based thin films

M. Abazari, A. Safari, S. S.N. Bharadwaja, S. Trolier-Mckinstry

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Abstract

Dielectric and piezoelectric properties of morphotropic phase boundary (Bi,Na)TiO3-(Bi,K)TiO3-BaTiO3 epitaxial thin films deposited on SrRuO3 coated SrTiO3 substrates were reported. Thin films of 350 nm thickness exhibited small signal dielectric permittivity and loss tangent values of 750 and 0.15, respectively, at 1 kHz. Ferroelectric hysteresis measurements indicated a remanent polarization value of 30 μC/cm2 with a coercive field of 85-100 kV/cm. The thin film transverse piezoelectric coefficient (e31,f) of these films after poling at 600 kV/cm was found to be -2.2 C/ m2. The results indicate that these BNT-based thin films are a potential candidate for lead-free piezoelectric devices.

Original languageEnglish (US)
Article number082903
JournalApplied Physics Letters
Volume96
Issue number8
DOIs
StatePublished - Mar 12 2010

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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