Dielectric and structural characterization of high-temperature ferroelectric xBi(Zn1/2Ti1/2)O3-yPbZrO 3-zPbTiO3 perovskite ternary solid solution

Akansha Dwivedi, Clive A. Randall

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This paper reports the development of a new bismuth and lead oxide-based high-temperature ferroelectric ternary solid solution xBi(Zn 1/2Ti1/2)O3-yPbZrO3-zPbTiO 3 (xBZT-yPZ-zPT). Structural analysis has been carried out by XRD and SEM. A morphotropic phase boundary (MPB) between rhombohedral and tetragonal phases has been located on a pseudobinary line 0.1BZT-0.9[(1-x)PZ-xPT] within the ternary phase diagram. Dielectric studies of various compositions along the pseudobinary line 0.1BZT-0.9[(1-x)PZ-xPT] have been carried out in a wide range of temperatures from room temperature to 600 C, on both poled and unpoled samples. Compositions near the MPB exhibit high dielectric permittivity (∼23 000-28 000). Rhombohedral compositions show a diffuse phase transition with a small frequency dispersion. Based on the dielectric properties and differential scanning calorimetry, phase transition trends versus composition along the pseudobinary line 0.1BZT-0.9[(1-x)PZ-xPT] have been demonstrated.

Original languageEnglish (US)
Article number074102
JournalJournal of Applied Physics
Issue number7
StatePublished - Apr 1 2011


All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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