Dielectric and transverse piezoelectric properties of sol-gel-derived (001) Pb[Yb1/2Nb1/2]O3-PbTiO3 epitaxial thin films

Q. F. Zhou, Q. Q. Zhang, T. Yoshimura, S. Trolier-McKinstry

Research output: Contribution to journalArticlepeer-review

19 Scopus citations


The dielectric and transverse piezoelectric properties of sol-gel processed perovskite phase (001) of epitaxial thin films were investigated. Within the frequency range of 100 to 10000 Hz only slight variations were seen in the dielectric permittivity and dielectric loss measurements. The remanent polarization and transverse piezoelectric coefficient of the film were obtained as 37 μC/m2 and -10.2 C/m2, respectively.

Original languageEnglish (US)
Pages (from-to)4767-4769
Number of pages3
JournalApplied Physics Letters
Issue number26
StatePublished - Jun 30 2003

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)


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