Dielectric and transverse piezoelectric properties of sol-gel-derived (001) Pb[Yb1/2Nb1/2]O3-PbTiO3 epitaxial thin films

Q. F. Zhou, Q. Q. Zhang, T. Yoshimura, Susan E. Trolier-McKinstry

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Abstract

The dielectric and transverse piezoelectric properties of sol-gel processed perovskite phase (001) of epitaxial thin films were investigated. Within the frequency range of 100 to 10000 Hz only slight variations were seen in the dielectric permittivity and dielectric loss measurements. The remanent polarization and transverse piezoelectric coefficient of the film were obtained as 37 μC/m2 and -10.2 C/m2, respectively.

Original languageEnglish (US)
Pages (from-to)4767-4769
Number of pages3
JournalApplied Physics Letters
Volume82
Issue number26
DOIs
Publication statusPublished - Jun 30 2003

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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