Dielectric characterization of dielectric ceramic materials using terahertz time-domain spectroscopy

Khalid Z. Rajab, Steven Edward Perini, Joe Dougherty, Masato Iwasaki, Michael T. Lanagan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Applications for low temperature co-fired ceramics (LTCC) are advancing to higher frequencies. In order to design ceramic microsystems and high frequency packages, the electrical properties of materials must be well characterized. In this study, the dielectric properties of commercial and experimental ceramic materials have been measured over a broad frequency range. A split-cylinder method was employed for dielectric properties in the 10 GHz range. Terahertz spectroscopy was used to characterize ceramic specimens with a range of dielectric constants between 4 and 100. The measurements were made using a broadband terahertz spectroscopy system that provided time-domain transmission data. The dielectric constant and loss were extracted from the sample's frequency-domain transmission characteristics and compared with lower frequency measurements. Dielectric constant and loss data will be presented for commercial and experimental ceramic systems from 10 GHz to 1 THz.

Original languageEnglish (US)
Title of host publicationIMAPS/ACerS - 2nd International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies, CICMT 2006
Pages297-301
Number of pages5
StatePublished - 2006
Event2nd International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies, CICMT 2006 - Denver, CO, United States
Duration: Apr 24 2006Apr 27 2006

Other

Other2nd International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies, CICMT 2006
CountryUnited States
CityDenver, CO
Period4/24/064/27/06

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Ceramics and Composites

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    Rajab, K. Z., Perini, S. E., Dougherty, J., Iwasaki, M., & Lanagan, M. T. (2006). Dielectric characterization of dielectric ceramic materials using terahertz time-domain spectroscopy. In IMAPS/ACerS - 2nd International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies, CICMT 2006 (pp. 297-301)