Dielectric constant measurements of solid 4He

L. Yin, J. S. Xia, C. Huan, N. S. Sullivan, Moses Hung-Wai Chan

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Abstract

Careful measurements of the dielectric properties of solid 4He have been carried out down to 35 mK, considerably lower than the temperature range of previous studies. The sample was prepared from high purity gas with 3He concentrations of the order of 200 ppb and were formed by the blocked capillary method. The molar volume of the sample was 20.30 cm 3. The dielectric constant of the samples was found to be independent of temperature down to 120 mK before showing a continuous increase with decreasing temperature and saturating below 50 mK. The total increase in ε is 2 parts in 10 -5. The temperature dependence of ε mimics the increase in the resonant frequency found in the torsional oscillator studies and also the increase found in the shear modulus measurements.

Original languageEnglish (US)
Pages (from-to)407-411
Number of pages5
JournalJournal of Low Temperature Physics
Volume162
Issue number5-6
DOIs
StatePublished - Mar 1 2011

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Materials Science(all)
  • Condensed Matter Physics

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    Yin, L., Xia, J. S., Huan, C., Sullivan, N. S., & Chan, M. H-W. (2011). Dielectric constant measurements of solid 4He. Journal of Low Temperature Physics, 162(5-6), 407-411. https://doi.org/10.1007/s10909-010-0275-3