Dielectric enhancement and Maxwell-Wagner effects in polycrystalline ferroelectric multilayered thin films

Mingrong Shen, Shuibing Ge, Wenwu Cao

Research output: Contribution to journalArticlepeer-review

66 Scopus citations

Abstract

Dielectric enhancement was observed in polycrystalline BaTiO3/Ba0.6Sr0.4TiO3 multilayered thin films deposited layer-by-layer on Pt/Ti/SiO2/Si substrates via pulsed laser deposition. The dielectric constant of the films was enhanced more than four times with the decrease of the individual layer thickness down to 30 nm, while the dielectric loss was kept at a low level comparable to that of the solid solution Ba0.8Sr0.2TiO3 thin films. The Maxwell-Wagner model is proposed to explain the experimental data, which can predict both the dielectric enhancement and frequency dependence when the individual layer thickness is more than 40 nm.

Original languageEnglish (US)
Pages (from-to)2935-2938
Number of pages4
JournalJournal of Physics D: Applied Physics
Volume34
Issue number19
DOIs
StatePublished - Oct 7 2001

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

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