Dielectric functions of common ybco substrate materials determined by spectroscopic ellipsometry

Brady J. Gibbons, Susan Trolier-McKinstry

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16 Scopus citations

Abstract

Reference dielectric function data for several common YBa2Cu3O7-δ (YBCO) substrate materials have been determined by spectroscopic ellipsometry over the range 250 nm - 750 nm. These materials include LaAlO3, BaZrO3, NdGaO3, 9.5 mol% Y2O3-ZrO2 (YSZ), LaSrGaO4 (LSGO), and (LaAlO3)0.3-(Sr2AlTaO6) 0.7 (LSAT). The precision of the data was confirmed by comparing SE determined data for SrTiO3 to published values. Agreement to the third decimal point was shown. These data have been used to characterize interfaces between YBCO and some of these materials by SE.

Original languageEnglish (US)
Pages (from-to)2177-2180
Number of pages4
JournalIEEE Transactions on Applied Superconductivity
Volume7
Issue number2 PART 2
DOIs
StatePublished - 1997

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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