Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.
|Original language||English (US)|
|Number of pages||3|
|Journal||IEEE Transactions on Instrumentation and Measurement|
|State||Published - Oct 1992|
All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering