Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.

Original languageEnglish (US)
Pages (from-to)723-725
Number of pages3
JournalIEEE Transactions on Instrumentation and Measurement
Volume41
Issue number5
DOIs
StatePublished - Jan 1 1992

Fingerprint

Wavelength
wavelengths
Millimeter waves
millimeter waves
Frequency bands
permeability
Waveguides
Permittivity
frequency ranges
methodology
permittivity
waveguides

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Instrumentation

Cite this

@article{7aca8a17f2d2494e8c48aaf8a2d5a938,
title = "Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths",
abstract = "Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.",
author = "Dudeck, {Kenneth E.}",
year = "1992",
month = "1",
day = "1",
doi = "10.1109/19.177352",
language = "English (US)",
volume = "41",
pages = "723--725",
journal = "IEEE Transactions on Instrumentation and Measurement",
issn = "0018-9456",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "5",

}

Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths. / Dudeck, Kenneth E.

In: IEEE Transactions on Instrumentation and Measurement, Vol. 41, No. 5, 01.01.1992, p. 723-725.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths

AU - Dudeck, Kenneth E.

PY - 1992/1/1

Y1 - 1992/1/1

N2 - Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.

AB - Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.

UR - http://www.scopus.com/inward/record.url?scp=0026931327&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0026931327&partnerID=8YFLogxK

U2 - 10.1109/19.177352

DO - 10.1109/19.177352

M3 - Article

AN - SCOPUS:0026931327

VL - 41

SP - 723

EP - 725

JO - IEEE Transactions on Instrumentation and Measurement

JF - IEEE Transactions on Instrumentation and Measurement

SN - 0018-9456

IS - 5

ER -