Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths

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Abstract

Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.

Original languageEnglish (US)
Pages (from-to)723-725
Number of pages3
JournalIEEE Transactions on Instrumentation and Measurement
Volume41
Issue number5
DOIs
StatePublished - Oct 1992

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Electrical and Electronic Engineering

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