A transmission technique for dielectric measurements in the microwave region is presented. Thin specimens are longitudinally positioned at the center of a rectangular waveguide. Expressions for the real and imaginary parts of the permittivity are considered with different approximations. The suitability of the technique is evaluated for dielectric measurements of packaging materials. Experimental results are presented for Teflon, porous Vycor, and alumina in the X‐band frequency range.
|Original language||English (US)|
|Journal||Journal of the American Ceramic Society|
|State||Published - Jan 1 1987|
All Science Journal Classification (ASJC) codes
- Ceramics and Composites
- Materials Chemistry