Dielectric property measurement using a resonant nonradiative dielectric waveguide structure

Khalid Z. Rajab, Kuen Fwu Fuh, Raj Mittra, Michael T. Lanagan

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

This letter describes a new dielectric characterization technique, based on the resonant nonradiative waveguide structure described by Yoneyama and Nishida [1], for permittivity measurements at microwave and mm-wave frequencies. The measurement system is modeled as a resonator comprised of two parallel conducting plates with a rectangular dielectric slab sandwiched in-between. Resonant frequencies of the longitudinal section electric (LSE) modes and the unloaded Q of the cavity are used to determine the permittivity of the dielectric and its loss tangent, respectively. The technique is shown to be accurate for measuring the dielectric properties of a wide array of polymer and oxide materials. For materials with small dielectric loss tangents, an accuracy of better than ±0.4% is attained in the measurement of the relative dielectric constant of the material.

Original languageEnglish (US)
Pages (from-to)104-106
Number of pages3
JournalIEEE Microwave and Wireless Components Letters
Volume15
Issue number2
DOIs
StatePublished - Feb 1 2005

Fingerprint

Dielectric waveguides
dielectric waveguides
Dielectric properties
dielectric properties
Permittivity
permittivity
tangents
dielectric loss
Permittivity measurement
Dielectric losses
Resonators
Natural frequencies
Waveguides
Microwaves
resonant frequencies
slabs
Oxides
resonators
Polymers
waveguides

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

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Dielectric property measurement using a resonant nonradiative dielectric waveguide structure. / Rajab, Khalid Z.; Fuh, Kuen Fwu; Mittra, Raj; Lanagan, Michael T.

In: IEEE Microwave and Wireless Components Letters, Vol. 15, No. 2, 01.02.2005, p. 104-106.

Research output: Contribution to journalArticle

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