Diffraction efficiency of radially-profiled off-plane reflection gratings

Drew M. Miles, James H. Tutt, Casey T. DeRoo, Hannah Marlowe, Thomas J. Peterson, Randall L. McEntaffer, Benedikt Menz, Vadim Burwitz, Gisela Hartner, Christian Laubis, Frank Scholze

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Future X-ray missions will require gratings with high throughput and high spectral resolution. Blazed off-plane reflection gratings are capable of meeting these demands. A blazed grating profile optimizes grating efficiency, providing higher throughput to one side of zero-order on the arc of diffraction. This paper presents efficiency measurements made in the 0.3 - 1.5 keV energy band at the Physikalisch-Technische Bundesanstalt (PTB) BESSY II facility for three holographically-ruled gratings, two of which are blazed. Each blazed grating was tested in both the Littrow configuration and anti-Littrow configuration in order to test the alignment sensitivity of these gratings with regard to throughput. This paper outlines the procedure of the grating experiment performed at BESSY II and discuss the resulting efficiency measurements across various energies. Experimental results are generally consistent with theory and demonstrate that the blaze does increase throughput to one side of zero-order. However, the total efficiency of the non-blazed, sinusoidal grating is greater than that of the blazed gratings, which suggests that the method of manufacturing these blazed profiles fails to produce facets with the desired level of precision. Finally, evidence of a successful blaze implementation from first diffraction results of prototype blazed gratings produce via a new fabrication technique at the University of Iowa are presented.

Original languageEnglish (US)
Title of host publicationOptics for EUV, X-Ray, and Gamma-Ray Astronomy VII
EditorsGiovanni Pareschi, Stephen L. O'Dell, Giovanni Pareschi, Stephen L. O'Dell
PublisherSPIE
ISBN (Electronic)9781628417692, 9781628417692
DOIs
StatePublished - Jan 1 2015
EventOptics for EUV, X-Ray, and Gamma-Ray Astronomy VII - San Diego, United States
Duration: Aug 10 2015Aug 13 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9603
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherOptics for EUV, X-Ray, and Gamma-Ray Astronomy VII
CountryUnited States
CitySan Diego
Period8/10/158/13/15

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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