Diffraction of obliquely incident plane waves by resistive and conductive planar surfaces

Osman Yildirim, Ram Mohan Narayanan

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The multiple diffraction of obliquely incident plane waves by the three-part resistive and conductive plane is evaluated via uniform asymptotic high frequency analysis. This analysis is based on a spectral iteration technique consisting of employing the Fourier Integral representation of the diffracted field through the solution of a pair of uncoupled Wiener-Hopf equations. By studying these equations iteratively, the double and triple diffracted fields are obtained through the saddle-point technique. Some numerical examples are also presented.

Original languageEnglish (US)
Pages (from-to)145-151
Number of pages7
JournalAEU-Archiv fur Elektronik und Ubertragungstechnik
Volume56
Issue number3
StatePublished - Jun 8 2002

Fingerprint

Diffraction

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

Cite this

@article{48adcc9bf1ea4737b94bb65e1d047edc,
title = "Diffraction of obliquely incident plane waves by resistive and conductive planar surfaces",
abstract = "The multiple diffraction of obliquely incident plane waves by the three-part resistive and conductive plane is evaluated via uniform asymptotic high frequency analysis. This analysis is based on a spectral iteration technique consisting of employing the Fourier Integral representation of the diffracted field through the solution of a pair of uncoupled Wiener-Hopf equations. By studying these equations iteratively, the double and triple diffracted fields are obtained through the saddle-point technique. Some numerical examples are also presented.",
author = "Osman Yildirim and Narayanan, {Ram Mohan}",
year = "2002",
month = "6",
day = "8",
language = "English (US)",
volume = "56",
pages = "145--151",
journal = "AEU - International Journal of Electronics and Communications",
issn = "1434-8411",
publisher = "Urban und Fischer Verlag Jena",
number = "3",

}

Diffraction of obliquely incident plane waves by resistive and conductive planar surfaces. / Yildirim, Osman; Narayanan, Ram Mohan.

In: AEU-Archiv fur Elektronik und Ubertragungstechnik, Vol. 56, No. 3, 08.06.2002, p. 145-151.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Diffraction of obliquely incident plane waves by resistive and conductive planar surfaces

AU - Yildirim, Osman

AU - Narayanan, Ram Mohan

PY - 2002/6/8

Y1 - 2002/6/8

N2 - The multiple diffraction of obliquely incident plane waves by the three-part resistive and conductive plane is evaluated via uniform asymptotic high frequency analysis. This analysis is based on a spectral iteration technique consisting of employing the Fourier Integral representation of the diffracted field through the solution of a pair of uncoupled Wiener-Hopf equations. By studying these equations iteratively, the double and triple diffracted fields are obtained through the saddle-point technique. Some numerical examples are also presented.

AB - The multiple diffraction of obliquely incident plane waves by the three-part resistive and conductive plane is evaluated via uniform asymptotic high frequency analysis. This analysis is based on a spectral iteration technique consisting of employing the Fourier Integral representation of the diffracted field through the solution of a pair of uncoupled Wiener-Hopf equations. By studying these equations iteratively, the double and triple diffracted fields are obtained through the saddle-point technique. Some numerical examples are also presented.

UR - http://www.scopus.com/inward/record.url?scp=0036259405&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036259405&partnerID=8YFLogxK

M3 - Article

VL - 56

SP - 145

EP - 151

JO - AEU - International Journal of Electronics and Communications

JF - AEU - International Journal of Electronics and Communications

SN - 1434-8411

IS - 3

ER -