A precise method for the measurement of diffuse reflectance by using gas absorption spectroscopy technique with an integrating sphere is demonstrated. A quantitative relationship between the diffuse reflectance and the gas absorption spectrum is formulated, which has been further validated by experiments. The precision of the reflectivity measurement depends on the diameter and port fraction of the integrating sphere as well as gas concentration, and it increases linearly with the magnitude of the reflectivity. A high precision of 0.005% was achieved at the reflectivity of 0.98844(5).
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Metals and Alloys
- Electrical and Electronic Engineering
- Materials Chemistry