Direct experimental analysis of the relation between the grain structure and the distribution of critical current density in YBa2Cu 3Ox coated conductors

D. C. Van Der Laan, M. Dhallé, L. M. Naveira, H. J.N. Van Eck, A. Metz, Justin Schwartz, M. W. Davidson, B. Ten Haken, H. H.J. Ten Kate

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

We present a relatively simple experimental method to correlate the grain structure of YBa2Cu3Ox coated conductors with spatial variations of the critical current density on a macroscopic scale. Variations of the current density on a micrometre scale are visualized with magneto-optical imaging, using the flux trapped by colonies of grains to quantify the degree of connectivity. Integrating these trapped flux profiles over larger distances yields direct information of the critical current distribution on a millimetre scale, provided that contributions from negative return flux in colony boundaries are properly eliminated. Flux polarity is determined using the wavelength dependence of the Verdet constant. The validity of this analysis is demonstrated by comparing the results with direct transport data on the lateral current distribution, measured with the magnetic knife technique. The combination of both experiments shows that the critical current density is suppressed over several millimetres of conductor length at areas where a large number of high-angle grain boundaries or defects are present.

Original languageEnglish (US)
Pages (from-to)299-306
Number of pages8
JournalSuperconductor Science and Technology
Volume18
Issue number3
DOIs
StatePublished - Mar 1 2005

Fingerprint

Crystal microstructure
critical current
conductors
current density
Fluxes
current distribution
Critical currents
micrometers
polarity
Grain boundaries
Current density
grain boundaries
Imaging techniques
Wavelength
Defects
defects
profiles
wavelengths
Experiments

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Condensed Matter Physics
  • Metals and Alloys
  • Electrical and Electronic Engineering
  • Materials Chemistry

Cite this

Van Der Laan, D. C. ; Dhallé, M. ; Naveira, L. M. ; Van Eck, H. J.N. ; Metz, A. ; Schwartz, Justin ; Davidson, M. W. ; Ten Haken, B. ; Ten Kate, H. H.J. / Direct experimental analysis of the relation between the grain structure and the distribution of critical current density in YBa2Cu 3Ox coated conductors. In: Superconductor Science and Technology. 2005 ; Vol. 18, No. 3. pp. 299-306.
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Direct experimental analysis of the relation between the grain structure and the distribution of critical current density in YBa2Cu 3Ox coated conductors. / Van Der Laan, D. C.; Dhallé, M.; Naveira, L. M.; Van Eck, H. J.N.; Metz, A.; Schwartz, Justin; Davidson, M. W.; Ten Haken, B.; Ten Kate, H. H.J.

In: Superconductor Science and Technology, Vol. 18, No. 3, 01.03.2005, p. 299-306.

Research output: Contribution to journalArticle

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AU - Van Der Laan, D. C.

AU - Dhallé, M.

AU - Naveira, L. M.

AU - Van Eck, H. J.N.

AU - Metz, A.

AU - Schwartz, Justin

AU - Davidson, M. W.

AU - Ten Haken, B.

AU - Ten Kate, H. H.J.

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