Direct force balance method for atomic force microscopy lateral force calibration

David B. Asay, Seong H. Kim

Research output: Contribution to journalArticle

42 Citations (Scopus)

Abstract

A new and simple calibration method for atomic force microscopy (AFM) is developed. This nonscanning method is based on direct force balances on surfaces with known slopes. The lateral force calibration is performed during force-distance measurements for normal force calibration. This method requires a substrate with known slopes, the z motion of the piezocalibrated, and the normal spring constant known. This technique determines not only the lateral detector sensitivity (N/V) but also the detector offset (V/m) and off-centering angle (α) for asymmetric cantilever-tip geometries. Because it is nonscanning, the AFM cantilever can be calibrated without dulling the tip.

Original languageEnglish (US)
Article number043903
JournalReview of Scientific Instruments
Volume77
Issue number4
DOIs
StatePublished - May 15 2006

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Atomic force microscopy
atomic force microscopy
Calibration
Detectors
Distance measurement
Force measurement
slopes
detectors
Geometry
Substrates
geometry

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

@article{6a8789c78d76437c9a391d8d624e4ddd,
title = "Direct force balance method for atomic force microscopy lateral force calibration",
abstract = "A new and simple calibration method for atomic force microscopy (AFM) is developed. This nonscanning method is based on direct force balances on surfaces with known slopes. The lateral force calibration is performed during force-distance measurements for normal force calibration. This method requires a substrate with known slopes, the z motion of the piezocalibrated, and the normal spring constant known. This technique determines not only the lateral detector sensitivity (N/V) but also the detector offset (V/m) and off-centering angle (α) for asymmetric cantilever-tip geometries. Because it is nonscanning, the AFM cantilever can be calibrated without dulling the tip.",
author = "Asay, {David B.} and Kim, {Seong H.}",
year = "2006",
month = "5",
day = "15",
doi = "10.1063/1.2190210",
language = "English (US)",
volume = "77",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "4",

}

Direct force balance method for atomic force microscopy lateral force calibration. / Asay, David B.; Kim, Seong H.

In: Review of Scientific Instruments, Vol. 77, No. 4, 043903, 15.05.2006.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Direct force balance method for atomic force microscopy lateral force calibration

AU - Asay, David B.

AU - Kim, Seong H.

PY - 2006/5/15

Y1 - 2006/5/15

N2 - A new and simple calibration method for atomic force microscopy (AFM) is developed. This nonscanning method is based on direct force balances on surfaces with known slopes. The lateral force calibration is performed during force-distance measurements for normal force calibration. This method requires a substrate with known slopes, the z motion of the piezocalibrated, and the normal spring constant known. This technique determines not only the lateral detector sensitivity (N/V) but also the detector offset (V/m) and off-centering angle (α) for asymmetric cantilever-tip geometries. Because it is nonscanning, the AFM cantilever can be calibrated without dulling the tip.

AB - A new and simple calibration method for atomic force microscopy (AFM) is developed. This nonscanning method is based on direct force balances on surfaces with known slopes. The lateral force calibration is performed during force-distance measurements for normal force calibration. This method requires a substrate with known slopes, the z motion of the piezocalibrated, and the normal spring constant known. This technique determines not only the lateral detector sensitivity (N/V) but also the detector offset (V/m) and off-centering angle (α) for asymmetric cantilever-tip geometries. Because it is nonscanning, the AFM cantilever can be calibrated without dulling the tip.

UR - http://www.scopus.com/inward/record.url?scp=33646434817&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33646434817&partnerID=8YFLogxK

U2 - 10.1063/1.2190210

DO - 10.1063/1.2190210

M3 - Article

AN - SCOPUS:33646434817

VL - 77

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 4

M1 - 043903

ER -