Direct lattice parameter measurements using HAADF-STEM

Adedapo A. Oni, Xiahan Sang, Aakash Kumar, Selva V. Raju, Srikant Srinivasan, Susan Sinnott, Surendra Saxena, Krishna Rajan, James M. Lebeau

Research output: Contribution to journalConference article

Original languageEnglish (US)
Pages (from-to)1050-1051
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

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Lattice constants
lattice parameters

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Oni, A. A., Sang, X., Kumar, A., Raju, S. V., Srinivasan, S., Sinnott, S., ... Lebeau, J. M. (2014). Direct lattice parameter measurements using HAADF-STEM. Microscopy and Microanalysis, 20(3), 1050-1051. https://doi.org/10.1017/S1431927614006977
Oni, Adedapo A. ; Sang, Xiahan ; Kumar, Aakash ; Raju, Selva V. ; Srinivasan, Srikant ; Sinnott, Susan ; Saxena, Surendra ; Rajan, Krishna ; Lebeau, James M. / Direct lattice parameter measurements using HAADF-STEM. In: Microscopy and Microanalysis. 2014 ; Vol. 20, No. 3. pp. 1050-1051.
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Oni, AA, Sang, X, Kumar, A, Raju, SV, Srinivasan, S, Sinnott, S, Saxena, S, Rajan, K & Lebeau, JM 2014, 'Direct lattice parameter measurements using HAADF-STEM', Microscopy and Microanalysis, vol. 20, no. 3, pp. 1050-1051. https://doi.org/10.1017/S1431927614006977

Direct lattice parameter measurements using HAADF-STEM. / Oni, Adedapo A.; Sang, Xiahan; Kumar, Aakash; Raju, Selva V.; Srinivasan, Srikant; Sinnott, Susan; Saxena, Surendra; Rajan, Krishna; Lebeau, James M.

In: Microscopy and Microanalysis, Vol. 20, No. 3, 01.08.2014, p. 1050-1051.

Research output: Contribution to journalConference article

TY - JOUR

T1 - Direct lattice parameter measurements using HAADF-STEM

AU - Oni, Adedapo A.

AU - Sang, Xiahan

AU - Kumar, Aakash

AU - Raju, Selva V.

AU - Srinivasan, Srikant

AU - Sinnott, Susan

AU - Saxena, Surendra

AU - Rajan, Krishna

AU - Lebeau, James M.

PY - 2014/8/1

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DO - 10.1017/S1431927614006977

M3 - Conference article

AN - SCOPUS:84927932944

VL - 20

SP - 1050

EP - 1051

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - 3

ER -