Direct lattice parameter measurements using HAADF-STEM

Adedapo A. Oni, Xiahan Sang, Aakash Kumar, Selva V. Raju, Srikant Srinivasan, Susan Sinnott, Surendra Saxena, Krishna Rajan, James M. Lebeau

Research output: Contribution to journalConference article

Original languageEnglish (US)
Pages (from-to)1050-1051
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Oni, A. A., Sang, X., Kumar, A., Raju, S. V., Srinivasan, S., Sinnott, S., Saxena, S., Rajan, K., & Lebeau, J. M. (2014). Direct lattice parameter measurements using HAADF-STEM. Microscopy and Microanalysis, 20(3), 1050-1051. https://doi.org/10.1017/S1431927614006977