Direct measurement of the counterion distribution within swollen polyelectrolyte films

Vivek M. Prabhu, Bryan D. Vogt, Wen Li Wu, Jack F. Douglas, Eric K. Lin, Sushil K. Satija, Dario L. Goldfarb, Hiroshi Ito

Research output: Contribution to journalArticle

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Abstract

The depth profile of the counterion concentration within thin polyelectrolyte films was measured in situ using contrast variant specular neutron reflectivity to characterize the initial swelling stage of the film dissolution. We find substantial counterion depletion near the substrate and enrichment near the periphery of the film extending into the solution. These observations challenge our understanding of the charge distribution in polyelectrolyte films and are important for understanding film dissolution in medical and technological applications.

Original languageEnglish (US)
Pages (from-to)6647-6650
Number of pages4
JournalLangmuir
Volume21
Issue number15
DOIs
StatePublished - Jul 19 2005

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Spectroscopy
  • Electrochemistry

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  • Cite this

    Prabhu, V. M., Vogt, B. D., Wu, W. L., Douglas, J. F., Lin, E. K., Satija, S. K., Goldfarb, D. L., & Ito, H. (2005). Direct measurement of the counterion distribution within swollen polyelectrolyte films. Langmuir, 21(15), 6647-6650. https://doi.org/10.1021/la050353h