Direct measurement of the spin polarization (P) of the magnetic semiconductor Ga1-xMnxAs was carried out using Andreev reflection spectroscopy. The conductance spectra of high transparency junction showed an intrinsic value for P greater than 85%. Results showed an extreme sensitivity of the measured spin polarization to the nature and quality of the interface for the material.
|Original language||English (US)|
|Number of pages||4|
|Journal||Physical Review Letters|
|State||Published - Aug 1 2003|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)