Direct Measurement of the Spin Polarization of the Magnetic Semiconductor (Ga, Mn)As

J. G. Braden, J. S. Parker, P. Xiong, S. H. Chun, N. Samarth

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

We have carried out a direct measurement of the degree of spin polarization ([Formula presented]) of the magnetic semiconductor [Formula presented] using Andreev reflection spectroscopy. Analyses of the conductance spectra of high transparency [Formula presented] junctions consistently yield an intrinsic value for [Formula presented] greater than 85%. Our experiments also revealed an extreme sensitivity of the measured spin polarization to the nature and quality of the interface for this material.

Original languageEnglish (US)
JournalPhysical review letters
Volume91
Issue number5
DOIs
StatePublished - Jul 31 2003

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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