Direct measurements of exciton diffusion length limitations on organic solar cell performance

Derek R. Kozub, Kiarash Vakhshouri, Sameer Vajjala Kesava, Cheng Wang, Alexander Hexemer, Enrique Daniel Gomez

Research output: Contribution to journalArticle

29 Citations (Scopus)

Abstract

Through a combination of X-ray scattering and energy-filtered electron microscopy, we have quantitatively examined the relationship between the mesostructure of the photoactive layer and device performance in PBTTT/PC 71BM solar cells. We can predict device performance from X-ray structural data through a simple morphological model which includes the exciton diffusion length.

Original languageEnglish (US)
Pages (from-to)5859-5861
Number of pages3
JournalChemical Communications
Volume48
Issue number44
DOIs
StatePublished - Jun 4 2012

Fingerprint

X ray scattering
Excitons
Electron microscopy
Solar cells
X rays
Organic solar cells
LDS 751

All Science Journal Classification (ASJC) codes

  • Catalysis
  • Electronic, Optical and Magnetic Materials
  • Ceramics and Composites
  • Chemistry(all)
  • Surfaces, Coatings and Films
  • Metals and Alloys
  • Materials Chemistry

Cite this

Kozub, Derek R. ; Vakhshouri, Kiarash ; Kesava, Sameer Vajjala ; Wang, Cheng ; Hexemer, Alexander ; Gomez, Enrique Daniel. / Direct measurements of exciton diffusion length limitations on organic solar cell performance. In: Chemical Communications. 2012 ; Vol. 48, No. 44. pp. 5859-5861.
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Direct measurements of exciton diffusion length limitations on organic solar cell performance. / Kozub, Derek R.; Vakhshouri, Kiarash; Kesava, Sameer Vajjala; Wang, Cheng; Hexemer, Alexander; Gomez, Enrique Daniel.

In: Chemical Communications, Vol. 48, No. 44, 04.06.2012, p. 5859-5861.

Research output: Contribution to journalArticle

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AU - Gomez, Enrique Daniel

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