Abstract
Through a combination of X-ray scattering and energy-filtered electron microscopy, we have quantitatively examined the relationship between the mesostructure of the photoactive layer and device performance in PBTTT/PC71BM solar cells. We can predict device performance from X-ray structural data through a simple morphological model which includes the exciton diffusion length.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 5859-5861 |
| Number of pages | 3 |
| Journal | Chemical Communications |
| Volume | 48 |
| Issue number | 47 |
| DOIs | |
| State | Published - May 17 2012 |
All Science Journal Classification (ASJC) codes
- Catalysis
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Chemistry(all)
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry
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Cite this
Kozub, D. R., Vakhshouri, K., Kesava, S. V., Wang, C., Hexemer, A., & Gomez, E. D. (2012). Direct measurements of exciton diffusion length limitations on organic solar cell performance. Chemical Communications, 48(47), 5859-5861. https://doi.org/10.1039/c2cc31925j