Abstract

The short run problems is ill-posed since with few data, it is not possible to have as small false alarm rate and as efficient shift detection properties as in the known parameter case. There are inherently trade-offs between false alarm rate, and the shift detection capabilities. The real issue is that different methods for short run statistical process control (SPC) will provide different trade-offs. This paper focuses on Q charts and in general on statistical process control methods for short run processes.

Original languageEnglish (US)
Pages (from-to)316-321
Number of pages6
JournalJournal of Quality Technology
Volume27
Issue number4
StatePublished - Oct 1995

Fingerprint

Statistical process control
Statistical Process Control
False Alarm Rate
Trade-offs
Chart
Short-run

All Science Journal Classification (ASJC) codes

  • Management Science and Operations Research
  • Industrial and Manufacturing Engineering
  • Statistics and Probability

Cite this

Del Castillo, Enrique. / Discussion. In: Journal of Quality Technology. 1995 ; Vol. 27, No. 4. pp. 316-321.
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Del Castillo, E 1995, 'Discussion', Journal of Quality Technology, vol. 27, no. 4, pp. 316-321.

Discussion. / Del Castillo, Enrique.

In: Journal of Quality Technology, Vol. 27, No. 4, 10.1995, p. 316-321.

Research output: Contribution to journalArticle

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