Disorder dominated microwave conductance spectra of doped silicon nanowire arrays

Clark Highstrete, Mark Lee, Aaron L. Vallett, Sarah M. Eichfeld, Joan Marie Redwing, Theresa S. Mayer

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Conductance spectra of doped silicon nanowire (SiNW) arrays were measured from 0.5 to 50 GHz at temperatures between 4 and 293 K. For arrays consisting of 11 to >10 4 SiNWs, the conductance was found to increase with frequency as f s, with 0.25 < s < 0.45, consistent with behavior found universally in disordered systems. A possible cause is disorder from Si/SiO x interface states dominating the conductance due to the high surface-to-volume ratio of the nanowires.

Original languageEnglish (US)
Pages (from-to)1557-1561
Number of pages5
JournalNano Letters
Volume8
Issue number6
DOIs
StatePublished - Jun 1 2008

Fingerprint

Silicon
Nanowires
nanowires
Microwaves
disorders
microwaves
Interface states
silicon
causes
Temperature
temperature

All Science Journal Classification (ASJC) codes

  • Bioengineering
  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering

Cite this

Highstrete, C., Lee, M., Vallett, A. L., Eichfeld, S. M., Redwing, J. M., & Mayer, T. S. (2008). Disorder dominated microwave conductance spectra of doped silicon nanowire arrays. Nano Letters, 8(6), 1557-1561. https://doi.org/10.1021/nl072496p
Highstrete, Clark ; Lee, Mark ; Vallett, Aaron L. ; Eichfeld, Sarah M. ; Redwing, Joan Marie ; Mayer, Theresa S. / Disorder dominated microwave conductance spectra of doped silicon nanowire arrays. In: Nano Letters. 2008 ; Vol. 8, No. 6. pp. 1557-1561.
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Highstrete, C, Lee, M, Vallett, AL, Eichfeld, SM, Redwing, JM & Mayer, TS 2008, 'Disorder dominated microwave conductance spectra of doped silicon nanowire arrays', Nano Letters, vol. 8, no. 6, pp. 1557-1561. https://doi.org/10.1021/nl072496p

Disorder dominated microwave conductance spectra of doped silicon nanowire arrays. / Highstrete, Clark; Lee, Mark; Vallett, Aaron L.; Eichfeld, Sarah M.; Redwing, Joan Marie; Mayer, Theresa S.

In: Nano Letters, Vol. 8, No. 6, 01.06.2008, p. 1557-1561.

Research output: Contribution to journalArticle

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AU - Mayer, Theresa S.

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