Abstract
The experimental measurement of second harmonic generation (SHG) and theoretical correlation of the SHG output to domain microstructure is presented for ferroelectric KNbO3 (110) thin films on a SrTiO3 (100) substrate. From X-ray diffraction, four possible domain variants in the film growth plane were determined to be KNbO3 [110]∥SrTiO3 [001], [001], [010], or [010] denoted as variants X+, X-, Y+, and Y-, respectively. From theoretical modeling of the SHG output from the film, the ratios of nonlinear coefficients d0/d32 and d24/d0 in the film were determined to be 2.19 ± 0.12 and 0.46 ± 0.26, respectively, in good agreement with the bulk KNbO3 crystals. The term d0 is defined as d15 + (d31 + d33)/2. The SHG can also distinguish between X+ and X-, as well as Y+ and Y-, domains, which was not possible by X-ray diffraction. The ratio of net area fraction (|AX+ - AX-|/|AY+ - AY-|) was determined to be 2.76 ± 1.06 in the probe area (2.25π mm2) where AX+, AX-, AY+, and AY- are the area fractions of domain variants X+, X-, Y+, and Y-, respectively, in the film growth plane.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 3289-3296 |
| Number of pages | 8 |
| Journal | Journal of the American Ceramic Society |
| Volume | 79 |
| Issue number | 12 |
| DOIs | |
| State | Published - Jan 1 1996 |
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All Science Journal Classification (ASJC) codes
- Ceramics and Composites
- Materials Chemistry
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Domain structure-second harmonic generation correlation in potassium niobate thin films deposited on a strontium titanate substrate. / Gopalan, Venkatraman; Raj, Rishi.
In: Journal of the American Ceramic Society, Vol. 79, No. 12, 01.01.1996, p. 3289-3296.Research output: Contribution to journal › Article
TY - JOUR
T1 - Domain structure-second harmonic generation correlation in potassium niobate thin films deposited on a strontium titanate substrate
AU - Gopalan, Venkatraman
AU - Raj, Rishi
PY - 1996/1/1
Y1 - 1996/1/1
N2 - The experimental measurement of second harmonic generation (SHG) and theoretical correlation of the SHG output to domain microstructure is presented for ferroelectric KNbO3 (110) thin films on a SrTiO3 (100) substrate. From X-ray diffraction, four possible domain variants in the film growth plane were determined to be KNbO3 [110]∥SrTiO3 [001], [001], [010], or [010] denoted as variants X+, X-, Y+, and Y-, respectively. From theoretical modeling of the SHG output from the film, the ratios of nonlinear coefficients d0/d32 and d24/d0 in the film were determined to be 2.19 ± 0.12 and 0.46 ± 0.26, respectively, in good agreement with the bulk KNbO3 crystals. The term d0 is defined as d15 + (d31 + d33)/2. The SHG can also distinguish between X+ and X-, as well as Y+ and Y-, domains, which was not possible by X-ray diffraction. The ratio of net area fraction (|AX+ - AX-|/|AY+ - AY-|) was determined to be 2.76 ± 1.06 in the probe area (2.25π mm2) where AX+, AX-, AY+, and AY- are the area fractions of domain variants X+, X-, Y+, and Y-, respectively, in the film growth plane.
AB - The experimental measurement of second harmonic generation (SHG) and theoretical correlation of the SHG output to domain microstructure is presented for ferroelectric KNbO3 (110) thin films on a SrTiO3 (100) substrate. From X-ray diffraction, four possible domain variants in the film growth plane were determined to be KNbO3 [110]∥SrTiO3 [001], [001], [010], or [010] denoted as variants X+, X-, Y+, and Y-, respectively. From theoretical modeling of the SHG output from the film, the ratios of nonlinear coefficients d0/d32 and d24/d0 in the film were determined to be 2.19 ± 0.12 and 0.46 ± 0.26, respectively, in good agreement with the bulk KNbO3 crystals. The term d0 is defined as d15 + (d31 + d33)/2. The SHG can also distinguish between X+ and X-, as well as Y+ and Y-, domains, which was not possible by X-ray diffraction. The ratio of net area fraction (|AX+ - AX-|/|AY+ - AY-|) was determined to be 2.76 ± 1.06 in the probe area (2.25π mm2) where AX+, AX-, AY+, and AY- are the area fractions of domain variants X+, X-, Y+, and Y-, respectively, in the film growth plane.
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U2 - 10.1111/j.1151-2916.1996.tb08107.x
DO - 10.1111/j.1151-2916.1996.tb08107.x
M3 - Article
AN - SCOPUS:0030414703
VL - 79
SP - 3289
EP - 3296
JO - Journal of the American Ceramic Society
JF - Journal of the American Ceramic Society
SN - 0002-7820
IS - 12
ER -