Dyakonov-Tamm waves localized to the planar interface of two chiral sculptured thin films

Jun Gao, Akhlesh Lakhtaki, Mingkai Lei

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The Dyakonov-Tamm wave combines the features of the Dyakonov wave and the Tamm electronic state. Dyakonov-Tamm waves guided by the planar interface of two dissimilar chiral sculptured thin films (STFs) were systematically examined. The interfaces result from the chiral STFs being dissimilar in (a) orientation about the helical axis, (b) structural handedness, (c) structural period, (d) vapor incidence angle, (e) material, or (f) various combinations thereof. A boundary-value problem for the propagation of Dyakonov-Tamm waves was formulated and numerically solved. Up to three physical solutions were obtained for any specific combination of constitutive properties of the two chiral STFs. Each solution indicates the existence of a Dyakonov-Tamm wave. If more than one solutions exist, the corresponding Dyakonov-Tamm waves differ in phase speed and degree of localization to the interface.

Original languageEnglish (US)
Title of host publicationNanostructured Thin Films III
DOIs
Publication statusPublished - Oct 28 2010
EventNanostructured Thin Films III - San Diego, CA, United States
Duration: Aug 4 2010Aug 5 2010

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7766
ISSN (Print)0277-786X

Other

OtherNanostructured Thin Films III
CountryUnited States
CitySan Diego, CA
Period8/4/108/5/10

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Cite this

Gao, J., Lakhtaki, A., & Lei, M. (2010). Dyakonov-Tamm waves localized to the planar interface of two chiral sculptured thin films. In Nanostructured Thin Films III [77660K] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7766). https://doi.org/10.1117/12.860073