Dynamic piezoresponse force microscopy: Spatially resolved probing of polarization dynamics in time and voltage domains

A. Kumar; Y. Ehara; A. Wada; H. Funakubo; F. Griggio; S. Trolier-Mckinstry; S. Jesse; S. V. Kalinin

doi:10.1063/1.4746080

Dynamic piezoresponse force microscopy: Spatially resolved probing of polarization dynamics in time and voltage domains

A. Kumar, Y. Ehara, A. Wada, H. Funakubo, F. Griggio, S. Trolier-Mckinstry, S. Jesse, S. V. Kalinin

Research output: Contribution to journal › Article › peer-review

28 Scopus citations

Abstract

An approach for probing dynamic phenomena during hysteresis loop measurements in piezoresponse force microscopy (PFM) is developed. Dynamic PFM (D-PFM) necessitates development of 5-dimensional (5D) data acquisition protocols and associated methods for analysis and visualization of multidimensional data. Using a combination of multivariate statistical analysis and phenomenological fitting, we explore dynamic behavior during polarization switching in model ferroelectric films with dense ferroelastic domain structures and in ferroelectric capacitors. In polydomain films, multivariate analysis of the switching data suggests that ferroelectric and ferroelastic components can be decoupled and time dynamics can be explored. In capacitors, a strong correlation between polarization dynamics and microstructure is observed. The future potential of D-PFM for probing time-dependent hysteretic phenomena in ferroelectrics and ionic systems is discussed.

Original language	English (US)
Article number	052021
Journal	Journal of Applied Physics
Volume	112
Issue number	5
DOIs	https://doi.org/10.1063/1.4746080
State	Published - Sep 1 2012

All Science Journal Classification (ASJC) codes

Physics and Astronomy(all)

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10.1063/1.4746080

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@article{2c835da9da8b4dc29467ce54346e1e28,

title = "Dynamic piezoresponse force microscopy: Spatially resolved probing of polarization dynamics in time and voltage domains",

abstract = "An approach for probing dynamic phenomena during hysteresis loop measurements in piezoresponse force microscopy (PFM) is developed. Dynamic PFM (D-PFM) necessitates development of 5-dimensional (5D) data acquisition protocols and associated methods for analysis and visualization of multidimensional data. Using a combination of multivariate statistical analysis and phenomenological fitting, we explore dynamic behavior during polarization switching in model ferroelectric films with dense ferroelastic domain structures and in ferroelectric capacitors. In polydomain films, multivariate analysis of the switching data suggests that ferroelectric and ferroelastic components can be decoupled and time dynamics can be explored. In capacitors, a strong correlation between polarization dynamics and microstructure is observed. The future potential of D-PFM for probing time-dependent hysteretic phenomena in ferroelectrics and ionic systems is discussed.",

author = "A. Kumar and Y. Ehara and A. Wada and H. Funakubo and F. Griggio and S. Trolier-Mckinstry and S. Jesse and Kalinin, {S. V.}",

note = "Funding Information: This research (A.K., S.V.K., S.J.) was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy. S.T.M. and F.G. gratefully acknowledge support from a National Security Science and Engineering Faculty Fellowship.",

year = "2012",

month = sep,

day = "1",

doi = "10.1063/1.4746080",

language = "English (US)",

volume = "112",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics Publising LLC",

number = "5",

}

TY - JOUR

T1 - Dynamic piezoresponse force microscopy

T2 - Spatially resolved probing of polarization dynamics in time and voltage domains

AU - Kumar, A.

AU - Ehara, Y.

AU - Wada, A.

AU - Funakubo, H.

AU - Griggio, F.

AU - Trolier-Mckinstry, S.

AU - Jesse, S.

AU - Kalinin, S. V.

N1 - Funding Information: This research (A.K., S.V.K., S.J.) was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy. S.T.M. and F.G. gratefully acknowledge support from a National Security Science and Engineering Faculty Fellowship.

PY - 2012/9/1

Y1 - 2012/9/1

N2 - An approach for probing dynamic phenomena during hysteresis loop measurements in piezoresponse force microscopy (PFM) is developed. Dynamic PFM (D-PFM) necessitates development of 5-dimensional (5D) data acquisition protocols and associated methods for analysis and visualization of multidimensional data. Using a combination of multivariate statistical analysis and phenomenological fitting, we explore dynamic behavior during polarization switching in model ferroelectric films with dense ferroelastic domain structures and in ferroelectric capacitors. In polydomain films, multivariate analysis of the switching data suggests that ferroelectric and ferroelastic components can be decoupled and time dynamics can be explored. In capacitors, a strong correlation between polarization dynamics and microstructure is observed. The future potential of D-PFM for probing time-dependent hysteretic phenomena in ferroelectrics and ionic systems is discussed.

AB - An approach for probing dynamic phenomena during hysteresis loop measurements in piezoresponse force microscopy (PFM) is developed. Dynamic PFM (D-PFM) necessitates development of 5-dimensional (5D) data acquisition protocols and associated methods for analysis and visualization of multidimensional data. Using a combination of multivariate statistical analysis and phenomenological fitting, we explore dynamic behavior during polarization switching in model ferroelectric films with dense ferroelastic domain structures and in ferroelectric capacitors. In polydomain films, multivariate analysis of the switching data suggests that ferroelectric and ferroelastic components can be decoupled and time dynamics can be explored. In capacitors, a strong correlation between polarization dynamics and microstructure is observed. The future potential of D-PFM for probing time-dependent hysteretic phenomena in ferroelectrics and ionic systems is discussed.

UR - http://www.scopus.com/inward/record.url?scp=84866403595&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84866403595&partnerID=8YFLogxK

U2 - 10.1063/1.4746080

DO - 10.1063/1.4746080

M3 - Article

AN - SCOPUS:84866403595

SN - 0021-8979

VL - 112

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 5

M1 - 052021

ER -

Dynamic piezoresponse force microscopy: Spatially resolved probing of polarization dynamics in time and voltage domains

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