Dynamic scaling of internal bias field in Mn-doped 0.24Pb(In1/2Nb1/2)O3–0.42Pb(Mg1/3Nb2/3)O3–0.34PbTiO3 ferroelectric ceramic

Xudong Qi; Enwei Sun; Shiyang Li; Weiming Lü; Rui Zhang; Bin Yang; Wenwu Cao

doi:10.1007/s10853-018-2586-8

Dynamic scaling of internal bias field in Mn-doped 0.24Pb(In_1/2Nb_1/2)O₃–0.42Pb(Mg_1/3Nb_2/3)O₃–0.34PbTiO₃ ferroelectric ceramic

Xudong Qi, Enwei Sun, Shiyang Li, Weiming Lü, Rui Zhang, Bin Yang, Wenwu Cao

Research output: Contribution to journal › Article › peer-review

8 Scopus citations

Abstract

The influences of temperature, electric field, and frequency on the internal bias field E_i have been investigated in poled and aged Mn-doped 0.24Pb(In_1/2Nb_1/2)O₃–0.42Pb(Mg_1/3Nb_2/3)O₃–0.34PbTiO₃ ferroelectric ceramic. It was found that E_i decreases with temperature T and electric field amplitude E₀, but increases with frequency f. The relaxation behavior of the internal bias field is related to the redistribution of preferentially oriented defect dipoles. Based on our results, scaling relations of E_i on temperature, electric field, and frequency were established in both rhombohedral and tetragonal phases, which provide the foundation for making “harder” piezoelectric materials through point defect engineering in order to meet the demand of high-power piezoelectric device applications.

Original language	English (US)
Pages (from-to)	12762-12769
Number of pages	8
Journal	Journal of Materials Science
Volume	53
Issue number	18
DOIs	https://doi.org/10.1007/s10853-018-2586-8
State	Published - Sep 1 2018

All Science Journal Classification (ASJC) codes

Materials Science(all)
Mechanics of Materials
Mechanical Engineering

Access to Document

10.1007/s10853-018-2586-8

Fingerprint

Dive into the research topics of 'Dynamic scaling of internal bias field in Mn-doped 0.24Pb(In1/2Nb1/2)O3–0.42Pb(Mg1/3Nb2/3)O3–0.34PbTiO3 ferroelectric ceramic'. Together they form a unique fingerprint.

Cite this

@article{d9a65722aa3e4832997eeb89f1599eab,

title = "Dynamic scaling of internal bias field in Mn-doped 0.24Pb(In1/2Nb1/2)O3–0.42Pb(Mg1/3Nb2/3)O3–0.34PbTiO3 ferroelectric ceramic",

abstract = "The influences of temperature, electric field, and frequency on the internal bias field Ei have been investigated in poled and aged Mn-doped 0.24Pb(In1/2Nb1/2)O3–0.42Pb(Mg1/3Nb2/3)O3–0.34PbTiO3 ferroelectric ceramic. It was found that Ei decreases with temperature T and electric field amplitude E0, but increases with frequency f. The relaxation behavior of the internal bias field is related to the redistribution of preferentially oriented defect dipoles. Based on our results, scaling relations of Ei on temperature, electric field, and frequency were established in both rhombohedral and tetragonal phases, which provide the foundation for making “harder” piezoelectric materials through point defect engineering in order to meet the demand of high-power piezoelectric device applications.",

author = "Xudong Qi and Enwei Sun and Shiyang Li and Weiming L{\"u} and Rui Zhang and Bin Yang and Wenwu Cao",

note = "Funding Information: This research was supported in part by the NSFC under Grant Nos. 51575344, 11304061, 51602080, and 51572056, the National Key Basic Research Program of China (973 Program) under Grant No. 2013CB632900. Publisher Copyright: {\textcopyright} 2018, Springer Science+Business Media, LLC, part of Springer Nature.",

year = "2018",

month = sep,

day = "1",

doi = "10.1007/s10853-018-2586-8",

language = "English (US)",

volume = "53",

pages = "12762--12769",

journal = "Journal of Materials Science",

issn = "0022-2461",

publisher = "Springer Netherlands",

number = "18",

}

TY - JOUR

T1 - Dynamic scaling of internal bias field in Mn-doped 0.24Pb(In1/2Nb1/2)O3–0.42Pb(Mg1/3Nb2/3)O3–0.34PbTiO3 ferroelectric ceramic

AU - Qi, Xudong

AU - Sun, Enwei

AU - Li, Shiyang

AU - Lü, Weiming

AU - Zhang, Rui

AU - Yang, Bin

AU - Cao, Wenwu

N1 - Funding Information: This research was supported in part by the NSFC under Grant Nos. 51575344, 11304061, 51602080, and 51572056, the National Key Basic Research Program of China (973 Program) under Grant No. 2013CB632900. Publisher Copyright: © 2018, Springer Science+Business Media, LLC, part of Springer Nature.

PY - 2018/9/1

Y1 - 2018/9/1

N2 - The influences of temperature, electric field, and frequency on the internal bias field Ei have been investigated in poled and aged Mn-doped 0.24Pb(In1/2Nb1/2)O3–0.42Pb(Mg1/3Nb2/3)O3–0.34PbTiO3 ferroelectric ceramic. It was found that Ei decreases with temperature T and electric field amplitude E0, but increases with frequency f. The relaxation behavior of the internal bias field is related to the redistribution of preferentially oriented defect dipoles. Based on our results, scaling relations of Ei on temperature, electric field, and frequency were established in both rhombohedral and tetragonal phases, which provide the foundation for making “harder” piezoelectric materials through point defect engineering in order to meet the demand of high-power piezoelectric device applications.

AB - The influences of temperature, electric field, and frequency on the internal bias field Ei have been investigated in poled and aged Mn-doped 0.24Pb(In1/2Nb1/2)O3–0.42Pb(Mg1/3Nb2/3)O3–0.34PbTiO3 ferroelectric ceramic. It was found that Ei decreases with temperature T and electric field amplitude E0, but increases with frequency f. The relaxation behavior of the internal bias field is related to the redistribution of preferentially oriented defect dipoles. Based on our results, scaling relations of Ei on temperature, electric field, and frequency were established in both rhombohedral and tetragonal phases, which provide the foundation for making “harder” piezoelectric materials through point defect engineering in order to meet the demand of high-power piezoelectric device applications.

UR - http://www.scopus.com/inward/record.url?scp=85048662060&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85048662060&partnerID=8YFLogxK

U2 - 10.1007/s10853-018-2586-8

DO - 10.1007/s10853-018-2586-8

M3 - Article

AN - SCOPUS:85048662060

VL - 53

SP - 12762

EP - 12769

JO - Journal of Materials Science

JF - Journal of Materials Science

SN - 0022-2461

IS - 18

ER -