Dynamics displayed by energetic C60 bombardment of metal overlayers on an organic substrate

Paul E. Kennedy, Zbigniew Postawa, Barbara J. Garrison

Research output: Contribution to journalArticlepeer-review

3 Scopus citations


Cluster bombardments of 15 keV C60 on metal-organic interfaces composed of silver atoms and octatetraene molecules were modeled using molecular dynamics computer simulations. Dynamics revealed by the simulations include the formation of holes in the metal overlayers from which underlying organic molecules are sputtered predominantly by a rapid jetlike motion and the implantation of metal atoms and clusters in the underlying organic solid. Both of these processes negatively affect the information depth for cluster bombardment of metal-organic interfaces; therefore, the simulations presented here give a clear picture of the issues associated with depth profiling through metal-organic interfaces.

Original languageEnglish (US)
Pages (from-to)2348-2355
Number of pages8
JournalAnalytical Chemistry
Issue number4
StatePublished - Feb 19 2013

All Science Journal Classification (ASJC) codes

  • Analytical Chemistry


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