Effect of film thickness on the validity of the sauerbrey equation for hydrated polyelectrolyte films

Bryan Vogt, Eric K. Lin, Wen Ii Wu, Christopher C. White

Research output: Contribution to journalArticle

160 Citations (Scopus)

Abstract

The frequency and energy dissipation change of a quartz crystal microbalance during moisture absorption was measured for films with thickness ranging from 3 to 205 nm. Evidence of the viscoelastic nature of the films was observed for films thicker than 90 nm through the frequency and energy dissipation changes. For sufficiently thin films (t < 40 nm), the frequency change could be effectively modeled as a simple increase in mass, as predicted by the Sauerbrey equation. The viscosity of the swollen films was independent, of initial polymer film thickness (93-205 nm). The equilibrium swelling ratio was independent of film thickness for all films examined (3-205 nm). The transition between the observation of a rigid film and a film showing viscoelastic character was found to be at β1D = 0.26 ± 0.10, where β1 = 2π/λs, λ s is the shear wavelength, and D is the film thickness. This transition agrees with the predictions of White and Schrag (J. Chem. Phys. 1999, 111, 11192).

Original languageEnglish (US)
Pages (from-to)12685-12690
Number of pages6
JournalJournal of Physical Chemistry B
Volume108
Issue number34
DOIs
StatePublished - Aug 26 2004

Fingerprint

Polyelectrolytes
Film thickness
film thickness
Energy dissipation
dissipation
energy dissipation
Quartz crystal microbalances
quartz crystals
Polymer films
Thick films
moisture
swelling
microbalances
thick films
Swelling
Moisture
Viscosity
viscosity
shear
Thin films

All Science Journal Classification (ASJC) codes

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Vogt, Bryan ; Lin, Eric K. ; Wu, Wen Ii ; White, Christopher C. / Effect of film thickness on the validity of the sauerbrey equation for hydrated polyelectrolyte films. In: Journal of Physical Chemistry B. 2004 ; Vol. 108, No. 34. pp. 12685-12690.
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Effect of film thickness on the validity of the sauerbrey equation for hydrated polyelectrolyte films. / Vogt, Bryan; Lin, Eric K.; Wu, Wen Ii; White, Christopher C.

In: Journal of Physical Chemistry B, Vol. 108, No. 34, 26.08.2004, p. 12685-12690.

Research output: Contribution to journalArticle

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AU - Vogt, Bryan

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AU - Wu, Wen Ii

AU - White, Christopher C.

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N2 - The frequency and energy dissipation change of a quartz crystal microbalance during moisture absorption was measured for films with thickness ranging from 3 to 205 nm. Evidence of the viscoelastic nature of the films was observed for films thicker than 90 nm through the frequency and energy dissipation changes. For sufficiently thin films (t < 40 nm), the frequency change could be effectively modeled as a simple increase in mass, as predicted by the Sauerbrey equation. The viscosity of the swollen films was independent, of initial polymer film thickness (93-205 nm). The equilibrium swelling ratio was independent of film thickness for all films examined (3-205 nm). The transition between the observation of a rigid film and a film showing viscoelastic character was found to be at β1D = 0.26 ± 0.10, where β1 = 2π/λs, λ s is the shear wavelength, and D is the film thickness. This transition agrees with the predictions of White and Schrag (J. Chem. Phys. 1999, 111, 11192).

AB - The frequency and energy dissipation change of a quartz crystal microbalance during moisture absorption was measured for films with thickness ranging from 3 to 205 nm. Evidence of the viscoelastic nature of the films was observed for films thicker than 90 nm through the frequency and energy dissipation changes. For sufficiently thin films (t < 40 nm), the frequency change could be effectively modeled as a simple increase in mass, as predicted by the Sauerbrey equation. The viscosity of the swollen films was independent, of initial polymer film thickness (93-205 nm). The equilibrium swelling ratio was independent of film thickness for all films examined (3-205 nm). The transition between the observation of a rigid film and a film showing viscoelastic character was found to be at β1D = 0.26 ± 0.10, where β1 = 2π/λs, λ s is the shear wavelength, and D is the film thickness. This transition agrees with the predictions of White and Schrag (J. Chem. Phys. 1999, 111, 11192).

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