Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates

Che Hui Lee, Volodymyr Skoromets, Michael D. Biegalski, Shiming Lei, Ryan Haislmaier, Margitta Bernhagen, Reinhard Uecker, Xiaoxing Xi, Venkatraman Gopalan, Xavier Martí, Stanislav Kamba, Petr Kužel, Darrell G. Schlom

Research output: Contribution to journalArticle

27 Citations (Scopus)

Abstract

The effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial Sr1+xTiO3+ δ films grown on DyScO3 substrates is reported. Direct comparisons between nominally stoichiometric and non-stoichiometric films have been performed through measurements of lattice parameters, temperature-dependent permittivities, second harmonic generation, and terahertz dielectric spectra. The nominally stoichiometric film shows dispersion-free low-frequency permittivity with a sharp maximum and pronounced soft mode behavior. Our results suggest that strained perfectly stoichiometric SrTiO 3 films should not show relaxor behavior and that relaxor behavior emerges from defect dipoles that arise from non-stoichiometry in the highly polarizable strained SrTiO3 matrix.

Original languageEnglish (US)
Article number082905
JournalApplied Physics Letters
Volume102
Issue number8
DOIs
StatePublished - Feb 25 2013

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dielectric properties
stoichiometry
thin films
permittivity
lattice parameters
harmonic generations
dipoles
low frequencies
defects
matrices
temperature

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Lee, C. H., Skoromets, V., Biegalski, M. D., Lei, S., Haislmaier, R., Bernhagen, M., ... Schlom, D. G. (2013). Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates. Applied Physics Letters, 102(8), [082905]. https://doi.org/10.1063/1.4793649
Lee, Che Hui ; Skoromets, Volodymyr ; Biegalski, Michael D. ; Lei, Shiming ; Haislmaier, Ryan ; Bernhagen, Margitta ; Uecker, Reinhard ; Xi, Xiaoxing ; Gopalan, Venkatraman ; Martí, Xavier ; Kamba, Stanislav ; Kužel, Petr ; Schlom, Darrell G. / Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates. In: Applied Physics Letters. 2013 ; Vol. 102, No. 8.
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Lee, CH, Skoromets, V, Biegalski, MD, Lei, S, Haislmaier, R, Bernhagen, M, Uecker, R, Xi, X, Gopalan, V, Martí, X, Kamba, S, Kužel, P & Schlom, DG 2013, 'Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates', Applied Physics Letters, vol. 102, no. 8, 082905. https://doi.org/10.1063/1.4793649

Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates. / Lee, Che Hui; Skoromets, Volodymyr; Biegalski, Michael D.; Lei, Shiming; Haislmaier, Ryan; Bernhagen, Margitta; Uecker, Reinhard; Xi, Xiaoxing; Gopalan, Venkatraman; Martí, Xavier; Kamba, Stanislav; Kužel, Petr; Schlom, Darrell G.

In: Applied Physics Letters, Vol. 102, No. 8, 082905, 25.02.2013.

Research output: Contribution to journalArticle

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AU - Lee, Che Hui

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AU - Bernhagen, Margitta

AU - Uecker, Reinhard

AU - Xi, Xiaoxing

AU - Gopalan, Venkatraman

AU - Martí, Xavier

AU - Kamba, Stanislav

AU - Kužel, Petr

AU - Schlom, Darrell G.

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