Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates

Che Hui Lee, Volodymyr Skoromets, Michael D. Biegalski, Shiming Lei, Ryan Haislmaier, Margitta Bernhagen, Reinhard Uecker, Xiaoxing Xi, Venkatraman Gopalan, Xavier Martí, Stanislav Kamba, Petr Kužel, Darrell G. Schlom

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Abstract

The effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial Sr1+xTiO3+ δ films grown on DyScO3 substrates is reported. Direct comparisons between nominally stoichiometric and non-stoichiometric films have been performed through measurements of lattice parameters, temperature-dependent permittivities, second harmonic generation, and terahertz dielectric spectra. The nominally stoichiometric film shows dispersion-free low-frequency permittivity with a sharp maximum and pronounced soft mode behavior. Our results suggest that strained perfectly stoichiometric SrTiO 3 films should not show relaxor behavior and that relaxor behavior emerges from defect dipoles that arise from non-stoichiometry in the highly polarizable strained SrTiO3 matrix.

Original languageEnglish (US)
Article number082905
JournalApplied Physics Letters
Volume102
Issue number8
DOIs
StatePublished - Feb 25 2013

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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    Lee, C. H., Skoromets, V., Biegalski, M. D., Lei, S., Haislmaier, R., Bernhagen, M., Uecker, R., Xi, X., Gopalan, V., Martí, X., Kamba, S., Kužel, P., & Schlom, D. G. (2013). Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates. Applied Physics Letters, 102(8), [082905]. https://doi.org/10.1063/1.4793649