Effect of tensile strain on grain connectivity and flux pinning in Bi2 Sr 2 Ca 2 Cu 3 Ox tapes

D. C. Van Der Laan, J. W. Ekin, H. J.N. Van Eck, M. Dhallé, B. Ten Haken, M. W. Davidson, Justin Schwartz

Research output: Contribution to journalArticle

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Abstract

The grain-to-grain connectivity in Bi2 Sr2 Ca2 Cu3 Ox tapes is still poorly understood, even though they have been commercially available in long lengths for several years. This letter explains the effects of tensile strain on the grain-to-grain connectivity in Bi2 Sr2 Ca2 Cu3 Ox tapes. The different length scales at which damage to the grain structure occurs are studied with magneto-optical imaging, scanning-electron microscopy, and transport current. These data show that the initial degradation in critical current when strain exceeds the irreversible strain limit is caused by microcracks (∼100-500 nm in width) that form mainly at high-angle grain boundaries. Filament-wide cracks (∼5-10 μm in width) form at locations of lower grain density in the filaments at strains far exceeding the irreversible strain limit. However, in contrast to previous reports, a careful analysis of the pinning force as a function of tensile strain, taking into account current sharing with the normal matrix by using the offset criterion, shows that intragranular flux pinning is not affected by strain in any significant way.

Original languageEnglish (US)
Article number022511
Pages (from-to)1-3
Number of pages3
JournalApplied Physics Letters
Volume88
Issue number2
DOIs
StatePublished - Jan 24 2006

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flux pinning
tapes
filaments
microcracks
critical current
cracks
grain boundaries
degradation
damage
scanning electron microscopy
matrices

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Van Der Laan, D. C., Ekin, J. W., Van Eck, H. J. N., Dhallé, M., Ten Haken, B., Davidson, M. W., & Schwartz, J. (2006). Effect of tensile strain on grain connectivity and flux pinning in Bi2 Sr 2 Ca 2 Cu 3 Ox tapes. Applied Physics Letters, 88(2), 1-3. [022511]. https://doi.org/10.1063/1.2165090
Van Der Laan, D. C. ; Ekin, J. W. ; Van Eck, H. J.N. ; Dhallé, M. ; Ten Haken, B. ; Davidson, M. W. ; Schwartz, Justin. / Effect of tensile strain on grain connectivity and flux pinning in Bi2 Sr 2 Ca 2 Cu 3 Ox tapes. In: Applied Physics Letters. 2006 ; Vol. 88, No. 2. pp. 1-3.
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Van Der Laan, DC, Ekin, JW, Van Eck, HJN, Dhallé, M, Ten Haken, B, Davidson, MW & Schwartz, J 2006, 'Effect of tensile strain on grain connectivity and flux pinning in Bi2 Sr 2 Ca 2 Cu 3 Ox tapes', Applied Physics Letters, vol. 88, no. 2, 022511, pp. 1-3. https://doi.org/10.1063/1.2165090

Effect of tensile strain on grain connectivity and flux pinning in Bi2 Sr 2 Ca 2 Cu 3 Ox tapes. / Van Der Laan, D. C.; Ekin, J. W.; Van Eck, H. J.N.; Dhallé, M.; Ten Haken, B.; Davidson, M. W.; Schwartz, Justin.

In: Applied Physics Letters, Vol. 88, No. 2, 022511, 24.01.2006, p. 1-3.

Research output: Contribution to journalArticle

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Van Der Laan DC, Ekin JW, Van Eck HJN, Dhallé M, Ten Haken B, Davidson MW et al. Effect of tensile strain on grain connectivity and flux pinning in Bi2 Sr 2 Ca 2 Cu 3 Ox tapes. Applied Physics Letters. 2006 Jan 24;88(2):1-3. 022511. https://doi.org/10.1063/1.2165090