Effect of thickness on the stress and magnetoelectric coupling in bilayered Pb(Zr0.52Ti0.48)O3-CoFe2O4 films

Jing Wang, Zheng Li, Jianjun Wang, Hongcai He, Cewen Nan

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

Magnetoelectric bilayered Pb(Zr0.52Ti0.48)O3-CoFe2O4(PZT-CFO) films with different PZT thicknesses were grown on (111)Pt/Ti/SiO2/Si substrates using chemical solution spin-coating. Structural characterization by X-ray diffraction and electron microscopy shows pure phases and well-defined interfaces between the PZT and CFO films. The CFO-PZT-substrate structure effectively alleviates the substrate clamping effect for the CFO layer, showing appreciable magnetoelectric responses in the composite films. Both the direct magnetoelectric effect and the magnetic field-induced Raman shifts in the A1(TO1) soft mode of PZT demonstrate the magnetic-mechanical-electric coupling in the films. The results also indicate that with a constant CFO layer thickness, the thickness of the PZT layer plays an important role in the stress relaxation and strong magnetoelectric coupling. The coupling could be further enhanced by increasing the CFO thickness, optimizing the volume (thickness) fraction of the PZT thickness, and releasing the clamping effect from the substrate.

Original languageEnglish (US)
Article number044101
JournalJournal of Applied Physics
Volume117
Issue number4
DOIs
StatePublished - Jan 28 2015

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stress relaxation
releasing
coating
electron microscopy
microscopy
composite materials
shift
diffraction
magnetic fields
x rays

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

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title = "Effect of thickness on the stress and magnetoelectric coupling in bilayered Pb(Zr0.52Ti0.48)O3-CoFe2O4 films",
abstract = "Magnetoelectric bilayered Pb(Zr0.52Ti0.48)O3-CoFe2O4(PZT-CFO) films with different PZT thicknesses were grown on (111)Pt/Ti/SiO2/Si substrates using chemical solution spin-coating. Structural characterization by X-ray diffraction and electron microscopy shows pure phases and well-defined interfaces between the PZT and CFO films. The CFO-PZT-substrate structure effectively alleviates the substrate clamping effect for the CFO layer, showing appreciable magnetoelectric responses in the composite films. Both the direct magnetoelectric effect and the magnetic field-induced Raman shifts in the A1(TO1) soft mode of PZT demonstrate the magnetic-mechanical-electric coupling in the films. The results also indicate that with a constant CFO layer thickness, the thickness of the PZT layer plays an important role in the stress relaxation and strong magnetoelectric coupling. The coupling could be further enhanced by increasing the CFO thickness, optimizing the volume (thickness) fraction of the PZT thickness, and releasing the clamping effect from the substrate.",
author = "Jing Wang and Zheng Li and Jianjun Wang and Hongcai He and Cewen Nan",
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Effect of thickness on the stress and magnetoelectric coupling in bilayered Pb(Zr0.52Ti0.48)O3-CoFe2O4 films. / Wang, Jing; Li, Zheng; Wang, Jianjun; He, Hongcai; Nan, Cewen.

In: Journal of Applied Physics, Vol. 117, No. 4, 044101, 28.01.2015.

Research output: Contribution to journalArticle

TY - JOUR

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AU - Wang, Jing

AU - Li, Zheng

AU - Wang, Jianjun

AU - He, Hongcai

AU - Nan, Cewen

PY - 2015/1/28

Y1 - 2015/1/28

N2 - Magnetoelectric bilayered Pb(Zr0.52Ti0.48)O3-CoFe2O4(PZT-CFO) films with different PZT thicknesses were grown on (111)Pt/Ti/SiO2/Si substrates using chemical solution spin-coating. Structural characterization by X-ray diffraction and electron microscopy shows pure phases and well-defined interfaces between the PZT and CFO films. The CFO-PZT-substrate structure effectively alleviates the substrate clamping effect for the CFO layer, showing appreciable magnetoelectric responses in the composite films. Both the direct magnetoelectric effect and the magnetic field-induced Raman shifts in the A1(TO1) soft mode of PZT demonstrate the magnetic-mechanical-electric coupling in the films. The results also indicate that with a constant CFO layer thickness, the thickness of the PZT layer plays an important role in the stress relaxation and strong magnetoelectric coupling. The coupling could be further enhanced by increasing the CFO thickness, optimizing the volume (thickness) fraction of the PZT thickness, and releasing the clamping effect from the substrate.

AB - Magnetoelectric bilayered Pb(Zr0.52Ti0.48)O3-CoFe2O4(PZT-CFO) films with different PZT thicknesses were grown on (111)Pt/Ti/SiO2/Si substrates using chemical solution spin-coating. Structural characterization by X-ray diffraction and electron microscopy shows pure phases and well-defined interfaces between the PZT and CFO films. The CFO-PZT-substrate structure effectively alleviates the substrate clamping effect for the CFO layer, showing appreciable magnetoelectric responses in the composite films. Both the direct magnetoelectric effect and the magnetic field-induced Raman shifts in the A1(TO1) soft mode of PZT demonstrate the magnetic-mechanical-electric coupling in the films. The results also indicate that with a constant CFO layer thickness, the thickness of the PZT layer plays an important role in the stress relaxation and strong magnetoelectric coupling. The coupling could be further enhanced by increasing the CFO thickness, optimizing the volume (thickness) fraction of the PZT thickness, and releasing the clamping effect from the substrate.

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