Effects of gamma-ray irradiation and electrical stress on ZnO thin film transistors

J. Israel Ramirez, Yuanyuan V. Li, Hitesh Basantani, Thomas Nelson Jackson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations
Original languageEnglish (US)
Title of host publication71st Device Research Conference, DRC 2013 - Conference Digest
Pages171-172
Number of pages2
DOIs
StatePublished - Dec 16 2013
Event71st Device Research Conference, DRC 2013 - Notre Dame, IN, United States
Duration: Jun 23 2013Jun 26 2013

Publication series

NameDevice Research Conference - Conference Digest, DRC
ISSN (Print)1548-3770

Other

Other71st Device Research Conference, DRC 2013
CountryUnited States
CityNotre Dame, IN
Period6/23/136/26/13

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Ramirez, J. I., Li, Y. V., Basantani, H., & Jackson, T. N. (2013). Effects of gamma-ray irradiation and electrical stress on ZnO thin film transistors. In 71st Device Research Conference, DRC 2013 - Conference Digest (pp. 171-172). [6633848] (Device Research Conference - Conference Digest, DRC). https://doi.org/10.1109/DRC.2013.6633848