Effects of gamma-ray irradiation and electrical stress on ZnO thin film transistors

J. Israel Ramirez, Yuanyuan V. Li, Hitesh Basantani, Thomas Nelson Jackson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)
Original languageEnglish (US)
Title of host publication71st Device Research Conference, DRC 2013 - Conference Digest
Pages171-172
Number of pages2
DOIs
StatePublished - Dec 16 2013
Event71st Device Research Conference, DRC 2013 - Notre Dame, IN, United States
Duration: Jun 23 2013Jun 26 2013

Publication series

NameDevice Research Conference - Conference Digest, DRC
ISSN (Print)1548-3770

Other

Other71st Device Research Conference, DRC 2013
CountryUnited States
CityNotre Dame, IN
Period6/23/136/26/13

Fingerprint

Thin film transistors
Gamma rays
Irradiation

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Cite this

Ramirez, J. I., Li, Y. V., Basantani, H., & Jackson, T. N. (2013). Effects of gamma-ray irradiation and electrical stress on ZnO thin film transistors. In 71st Device Research Conference, DRC 2013 - Conference Digest (pp. 171-172). [6633848] (Device Research Conference - Conference Digest, DRC). https://doi.org/10.1109/DRC.2013.6633848
Ramirez, J. Israel ; Li, Yuanyuan V. ; Basantani, Hitesh ; Jackson, Thomas Nelson. / Effects of gamma-ray irradiation and electrical stress on ZnO thin film transistors. 71st Device Research Conference, DRC 2013 - Conference Digest. 2013. pp. 171-172 (Device Research Conference - Conference Digest, DRC).
@inproceedings{b25752b2cf1f4b128fe5a5e7c223c27d,
title = "Effects of gamma-ray irradiation and electrical stress on ZnO thin film transistors",
author = "Ramirez, {J. Israel} and Li, {Yuanyuan V.} and Hitesh Basantani and Jackson, {Thomas Nelson}",
year = "2013",
month = "12",
day = "16",
doi = "10.1109/DRC.2013.6633848",
language = "English (US)",
isbn = "9781479908110",
series = "Device Research Conference - Conference Digest, DRC",
pages = "171--172",
booktitle = "71st Device Research Conference, DRC 2013 - Conference Digest",

}

Ramirez, JI, Li, YV, Basantani, H & Jackson, TN 2013, Effects of gamma-ray irradiation and electrical stress on ZnO thin film transistors. in 71st Device Research Conference, DRC 2013 - Conference Digest., 6633848, Device Research Conference - Conference Digest, DRC, pp. 171-172, 71st Device Research Conference, DRC 2013, Notre Dame, IN, United States, 6/23/13. https://doi.org/10.1109/DRC.2013.6633848

Effects of gamma-ray irradiation and electrical stress on ZnO thin film transistors. / Ramirez, J. Israel; Li, Yuanyuan V.; Basantani, Hitesh; Jackson, Thomas Nelson.

71st Device Research Conference, DRC 2013 - Conference Digest. 2013. p. 171-172 6633848 (Device Research Conference - Conference Digest, DRC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - Effects of gamma-ray irradiation and electrical stress on ZnO thin film transistors

AU - Ramirez, J. Israel

AU - Li, Yuanyuan V.

AU - Basantani, Hitesh

AU - Jackson, Thomas Nelson

PY - 2013/12/16

Y1 - 2013/12/16

UR - http://www.scopus.com/inward/record.url?scp=84890066843&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84890066843&partnerID=8YFLogxK

U2 - 10.1109/DRC.2013.6633848

DO - 10.1109/DRC.2013.6633848

M3 - Conference contribution

AN - SCOPUS:84890066843

SN - 9781479908110

T3 - Device Research Conference - Conference Digest, DRC

SP - 171

EP - 172

BT - 71st Device Research Conference, DRC 2013 - Conference Digest

ER -

Ramirez JI, Li YV, Basantani H, Jackson TN. Effects of gamma-ray irradiation and electrical stress on ZnO thin film transistors. In 71st Device Research Conference, DRC 2013 - Conference Digest. 2013. p. 171-172. 6633848. (Device Research Conference - Conference Digest, DRC). https://doi.org/10.1109/DRC.2013.6633848