Elastic property characterization in thin samples of sub-wavelength in thickness

Wenwu Cao

doi:10.1080/00150199808009169

Elastic property characterization in thin samples of sub-wavelength in thickness

Wenwu Cao

Research output: Contribution to journal › Conference article › peer-review

Abstract

A conflict exists in ultrasonic measurements between the resolution which requires higher frequency, and the penetration depth which requires long wavelength. Traditional pulse-echo method for elastic property measurements fails when the sample becomes too thin to allow the separation of repeated echoes. A data processing technique is described here which may provide a solution to this conflict. Elastic properties were successfully measured in samples as thin as 5% of the wavelength λ.

Original language	English (US)
Pages (from-to)	355-363
Number of pages	9
Journal	Ferroelectrics
Volume	206-207
Issue number	1 -4; 1-2
DOIs	https://doi.org/10.1080/00150199808009169
State	Published - 1998
Event	Proceedings of the 1997 Williamsburg Workshop on Ferroelectrics - Williamsburg, VA, USA Duration: Feb 2 1997 → Feb 5 1997

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1080/00150199808009169

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title = "Elastic property characterization in thin samples of sub-wavelength in thickness",

abstract = "A conflict exists in ultrasonic measurements between the resolution which requires higher frequency, and the penetration depth which requires long wavelength. Traditional pulse-echo method for elastic property measurements fails when the sample becomes too thin to allow the separation of repeated echoes. A data processing technique is described here which may provide a solution to this conflict. Elastic properties were successfully measured in samples as thin as 5% of the wavelength λ.",

author = "Wenwu Cao",

note = "Funding Information: This research is sponsored by the Office of Naval Research under grant #N00014-96-1-1173.; Proceedings of the 1997 Williamsburg Workshop on Ferroelectrics ; Conference date: 02-02-1997 Through 05-02-1997",

year = "1998",

doi = "10.1080/00150199808009169",

language = "English (US)",

volume = "206-207",

pages = "355--363",

journal = "Ferroelectrics",

issn = "0015-0193",

publisher = "Taylor and Francis Ltd.",

number = "1 -4; 1-2",

}

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T1 - Elastic property characterization in thin samples of sub-wavelength in thickness

AU - Cao, Wenwu

N1 - Funding Information: This research is sponsored by the Office of Naval Research under grant #N00014-96-1-1173.

PY - 1998

Y1 - 1998

N2 - A conflict exists in ultrasonic measurements between the resolution which requires higher frequency, and the penetration depth which requires long wavelength. Traditional pulse-echo method for elastic property measurements fails when the sample becomes too thin to allow the separation of repeated echoes. A data processing technique is described here which may provide a solution to this conflict. Elastic properties were successfully measured in samples as thin as 5% of the wavelength λ.

AB - A conflict exists in ultrasonic measurements between the resolution which requires higher frequency, and the penetration depth which requires long wavelength. Traditional pulse-echo method for elastic property measurements fails when the sample becomes too thin to allow the separation of repeated echoes. A data processing technique is described here which may provide a solution to this conflict. Elastic properties were successfully measured in samples as thin as 5% of the wavelength λ.

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U2 - 10.1080/00150199808009169

DO - 10.1080/00150199808009169

M3 - Conference article

AN - SCOPUS:0031653792

VL - 206-207

SP - 355

EP - 363

JO - Ferroelectrics

JF - Ferroelectrics

SN - 0015-0193

IS - 1 -4; 1-2

T2 - Proceedings of the 1997 Williamsburg Workshop on Ferroelectrics

Y2 - 2 February 1997 through 5 February 1997

ER -

Elastic property characterization in thin samples of sub-wavelength in thickness

Abstract

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