Elastic property characterization in thin samples of sub-wavelength in thickness

Research output: Contribution to journalConference articlepeer-review

Abstract

A conflict exists in ultrasonic measurements between the resolution which requires higher frequency, and the penetration depth which requires long wavelength. Traditional pulse-echo method for elastic property measurements fails when the sample becomes too thin to allow the separation of repeated echoes. A data processing technique is described here which may provide a solution to this conflict. Elastic properties were successfully measured in samples as thin as 5% of the wavelength λ.

Original languageEnglish (US)
Pages (from-to)355-363
Number of pages9
JournalFerroelectrics
Volume206-207
Issue number1 -4; 1-2
DOIs
StatePublished - 1998
EventProceedings of the 1997 Williamsburg Workshop on Ferroelectrics - Williamsburg, VA, USA
Duration: Feb 2 1997Feb 5 1997

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Elastic property characterization in thin samples of sub-wavelength in thickness'. Together they form a unique fingerprint.

Cite this